中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页 机构 成果 学者
  
  1. CAS IR Grid
  2. 新疆理化技术研究所
  3. 中国科学院新疆理化技术研究所
  4. 材料物理与化学研究室
Structural evolution and electric properties of low content Zr-doped BiFeO3 thin films

文献类型：会议论文

作者WangLei
出版日期2013
会议名称3rd International Conference on Chemical Engineering and Advanced Materials, CEAM 2013
会议日期July 6, 2013 - July 7, 2013
会议地点Guangzhou, China
页码817-820
中文摘要The pure and Zr-doped BiFeO3 thin films were fabricated on Pt/TiO2/SiO2/Si substrates by sol-gel method. The microstructural characterization revealed a phase structural transition from rhombohedral structure to tetragonal structure in Zr-doped BiFeO3 thin films. Compared with pureBiFeO3 thin film, the Zr-doped BiFeO3 thin films showed better dielectric and leakage current characteristics. The mechanism associated with the enhancement of the electrical properties of the thin films is also discussed.
收录类别EI
会议录出版地Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland
语种英语
ISSN号10226680
ISBN号9783037858141
源URL[http://ir.xjipc.cas.cn/handle/365002/3650]  
专题新疆理化技术研究所_材料物理与化学研究室
推荐引用方式
GB/T 7714		 WangLei. Structural evolution and electric properties of low content Zr-doped BiFeO3 thin films[C]. 见:3rd International Conference on Chemical Engineering and Advanced Materials, CEAM 2013. Guangzhou, China. July 6, 2013 - July 7, 2013.

入库方式： OAI收割

来源：新疆理化技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。