S-band backscattering analysis of wheat using tower-based scatterometer
文献类型：会议论文
| 作者 | Sun ; Zhang, Fengli ; Shao, Yun ; Liu, Li ; Wang, Guojun ; Bian, Xiaolin ; Li, Kun ; Wang, Xiaoli |
| 出版日期 | 2012 |
| 会议名称 | 2012 32nd IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2012, |
| 会议日期 | July 22, 2012 - July 27,2012 |
| 会议地点 | Munich, Germany |
| 关键词 | Backscattering Experiments Geology Meteorological instruments Remote sensing Soil moisture Synthetic aperture radar |
| 页码 | 4621-4624 |
| 收录类别 | EI |
| 会议录出版者 | Institute of Electrical and Electronics Engineers Inc. |
| 源URL | [http://ir.ceode.ac.cn/handle/183411/31090]  |
| 专题 | 遥感与数字地球研究所_EI会议论文_会议论文 |
| 推荐引用方式 GB/T 7714 | Sun,Zhang, Fengli,Shao, Yun,et al. S-band backscattering analysis of wheat using tower-based scatterometer[C]. 见:2012 32nd IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2012,. Munich, Germany. July 22, 2012 - July 27,2012. |
入库方式： OAI收割
来源：遥感与数字地球研究所
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