临近空间大气中子诱发电子器件单粒子翻转模拟研究
文献类型：期刊论文
| 作者 | 张振力; 张振龙; 韩建伟; 安广朋; 蔡明辉; 封国强; 马英起 |
| 刊名 | 空间科学学报
 |
| 出版日期 | 2011 |
| 卷号 | 31期号:3页码:350-354 |
| ISSN号 | 0254-6124 |
| 关键词 | 单粒子翻转 中子 敏感体积 Weibull函数 |
| 其他题名 | Simulation Study on Single Event Upset Induced by Near Space Atmospheric Neutron in Electronic Devices |
| 通讯作者 | zzl2516@tom.com |
| 中文摘要 | 根据重离子试验数据,采用长方体(RPP)模型,用GEANT4软件工具包编程,建立了垂直于器件表面入射的中子诱发电子器件的单粒子翻转模型.考虑敏感体积及其附近的次级粒子对单粒子翻转的贡献,统计了次级粒子在敏感体积内沉积能量的微分能谱分布,对在敏感体积内沉积不同能量的次级粒子对单粒子翻转的贡献进行了区分计算,模拟计算结果与地面试验结果符合较好. |
| 英文摘要 | Single Event Upset(SEU)induced by atmospheric neutron is harmful for near space craft,and is studied by numeric simulation in present paper.Static Random-Access Memory(SRAM)device which has regularly arrayed cells is selected as the simulation object.Using Rectangular Parallelepiped(RPP)Model as the basic model and extracting key parameters from SEU experiment data of heavy ions,sensitive volume model of SEU due to nuclear reactions between incident neutron and device materials is established.Simulation and research show that the secondary heavy ions resulting from the high energy neutrons can transfer approximate 4 microns.Consequently,to simulate the SEU events thoroughly,an extra volume beyond 4 microns from the sensitive volume is taken into account.Modeling and simulation are performed for HM62256 and HM628128 SRAM devices respectively with the help of GEANT4 software package.The secondary particles in and near the sensitive volume contributing to SEU are considered.Differential spectrums of the deposited energy in the sensitive volume by the secondary particles are calculated.Eventually SEU events due to the secondary particles which deposited different energy in the sensitive volume are summed up.The results of the simulation agree well with those of ground experiments performed with 14 MeV neutrons and high energy protons. |
| 学科主题 | 空间环境 |
| 资助信息 | 中国科学院创新基金课题资助 |
| 收录类别 | CSCD |
| 语种 | 中文 |
| CSCD记录号 | CSCD:4218432 |
| 公开日期 | 2014-12-15 |
| 源URL | [http://ir.nssc.ac.cn/handle/122/2854]  |
| 专题 | 国家空间科学中心_保障部/保障与试验验证中心 |
| 推荐引用方式 GB/T 7714 | 张振力,张振龙,韩建伟,等. 临近空间大气中子诱发电子器件单粒子翻转模拟研究[J]. 空间科学学报,2011,31(3):350-354. |
| APA | 张振力.,张振龙.,韩建伟.,安广朋.,蔡明辉.,...&马英起.(2011).临近空间大气中子诱发电子器件单粒子翻转模拟研究.空间科学学报,31(3),350-354. |
| MLA | 张振力,et al."临近空间大气中子诱发电子器件单粒子翻转模拟研究".空间科学学报 31.3(2011):350-354. |
入库方式： OAI收割
来源：国家空间科学中心
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