Prediction and measurement of thermal transport across interfaces between semiconductor and adjacent layers
文献类型：期刊论文
| 作者 | Xu, K ; Zhu, J
|
| 刊名 | INTERNATIONAL JOURNAL OF THERMAL SCIENCES
 |
| 出版日期 | 2014-05 |
| 卷号 | 79期号:0页码:266-275 |
| 关键词 | Thermal boundary conductance Two-color femtosecond laser pump-probe system Diffusive phonon scattering Semiconductor multilayer structure |
| 通讯作者 | Wang, ZL |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2014-12-12 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/1683]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_测试分析平台 |
| 推荐引用方式 GB/T 7714 | Xu, K,Zhu, J. Prediction and measurement of thermal transport across interfaces between semiconductor and adjacent layers[J]. INTERNATIONAL JOURNAL OF THERMAL SCIENCES,2014,79(0):266-275. |
| APA | Xu, K,&Zhu, J.(2014).Prediction and measurement of thermal transport across interfaces between semiconductor and adjacent layers.INTERNATIONAL JOURNAL OF THERMAL SCIENCES,79(0),266-275. |
| MLA | Xu, K,et al."Prediction and measurement of thermal transport across interfaces between semiconductor and adjacent layers".INTERNATIONAL JOURNAL OF THERMAL SCIENCES 79.0(2014):266-275. |
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