Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples
文献类型：期刊论文
| 作者 | Li, WB ; Yang, XY ; Zhu, JT ; Tu, YC ; Mu, BZ ; Yu, HS ; Wei, XJ ; Huang, YY ; Wang, ZS |
| 刊名 | JOURNAL OF SYNCHROTRON RADIATION
 |
| 出版日期 | 2014 |
| 卷号 | 21页码:561—567 |
| 关键词 | THIN-FILMS CONCENTRATED SAMPLES SCATTERING SPECTRA REFLECTIVITY PARAMETER EXAFS XAFS |
| ISSN号 | 0909-0495 |
| 通讯作者 | wangzs@tongji.edu.cn |
| 英文摘要 | A novel correction method for self-absorption effects is proposed for extended X-ray absorption fine structure (EXAFS) detected in the fluorescence mode on multilayer samples. The effects of refraction and multiple reflection at the interfaces are fully considered in this correction method. The correction is performed in k-space before any further data analysis, and it can be applied to single-layer or multilayer samples with flat surfaces and without thickness limit when the model parameters for the samples are known. The validity of this method is verified by the fluorescence EXAFS data collected for a Cr/C multilayer sample measured at different experimental geometries. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000335142900014 |
| 公开日期 | 2015-03-13 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/14057]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 推荐引用方式 GB/T 7714 | Li, WB,Yang, XY,Zhu, JT,et al. Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples[J]. JOURNAL OF SYNCHROTRON RADIATION,2014,21:561—567. |
| APA | Li, WB.,Yang, XY.,Zhu, JT.,Tu, YC.,Mu, BZ.,...&Wang, ZS.(2014).Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples.JOURNAL OF SYNCHROTRON RADIATION,21,561—567. |
| MLA | Li, WB,et al."Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples".JOURNAL OF SYNCHROTRON RADIATION 21(2014):561—567. |
入库方式： OAI收割
来源：上海应用物理研究所
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