中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Experimental study using Touschek lifetime as machine status flag in SSRF

文献类型:期刊论文

作者Chen, ZC ; Leng, YB ; Yuan, RX ; Yan, YB ; Yu, LY
刊名CHINESE PHYSICS C
出版日期2014
卷号38期号:7
ISSN号1674-1137
通讯作者chenzhichu@sinap.ac.cn ; lengyongbin@sinap.ac.cn
英文摘要The stabilities of the beam and machine have almost the highest priority in a modern light source. Although a lot of machine parameters could be used to represent the beam quality, there is no single parameter that could indicate the global information for the machine operators and accelerator physicists. For the last few years, a new parameter has been studied as a beam quality flag in the Shanghai Synchrotron Radiation Facility (SSRF). Calculations, simulations and detailed analysis of the real-time data from the storage ring have been made and the interesting results have confirmed its feasibility.
收录类别SCI
语种英语
WOS记录号WOS:000339228400022
公开日期2015-03-13
源URL[http://ir.sinap.ac.cn/handle/331007/14133]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
推荐引用方式
GB/T 7714
Chen, ZC,Leng, YB,Yuan, RX,et al. Experimental study using Touschek lifetime as machine status flag in SSRF[J]. CHINESE PHYSICS C,2014,38(7).
APA Chen, ZC,Leng, YB,Yuan, RX,Yan, YB,&Yu, LY.(2014).Experimental study using Touschek lifetime as machine status flag in SSRF.CHINESE PHYSICS C,38(7).
MLA Chen, ZC,et al."Experimental study using Touschek lifetime as machine status flag in SSRF".CHINESE PHYSICS C 38.7(2014).

入库方式: OAI收割

来源:上海应用物理研究所

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