Performance of the infrared microspectroscopy station at SSRF
文献类型：期刊论文
| 作者 | Zhang, ZY ; Chen, M ; Tong, YJ ; Ji, T ; Zhu, HC ; Peng, WW ; Zhang, M ; Li, YJ ; Xiao, TQ |
| 刊名 | INFRARED PHYSICS & TECHNOLOGY
 |
| 出版日期 | 2014 |
| 卷号 | 67页码:521—525 |
| 关键词 | CANADIAN LIGHT-SOURCE SYNCHROTRON-RADIATION RESOLUTION LIMITS BEAMLINE SPECTROMICROSCOPY SPECTROSCOPY FACILITY CELLS |
| ISSN号 | 1350-4495 |
| 通讯作者 | chenmin@sinap.ac.cn |
| 英文摘要 | At the third generation synchrotron light source Shanghai Synchrotron Radiation Facility (SSRF), the first infrared beamline BL01B has been successfully constructed. The infrared beamline collects both bending magnet and edge radiation. A brief introduction of the infrared beamline design has been given in this article. The infrared microspectroscopy station is equipped with a Nicolet 6700 FTIR spectrometer and a Nicolet Continuum Microscope. The flux at the entrance of the FTIR spectrometer, the intensity profile, the signal to noise ratio (SNR) with different apertures, and the focused spot size of the infrared microspectroscopy station have been measured. The performances with synchrotron radiation infrared source and internal globar source have been compared. The results indicate that the infrared microspectroscopy station at SSRF has the ability of analysis samples in a small area with diffraction limited spatial resolution. (C) 2014 Elsevier B.V. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000346549700077 |
| 公开日期 | 2015-03-13 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/14303]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 推荐引用方式 GB/T 7714 | Zhang, ZY,Chen, M,Tong, YJ,et al. Performance of the infrared microspectroscopy station at SSRF[J]. INFRARED PHYSICS & TECHNOLOGY,2014,67:521—525. |
| APA | Zhang, ZY.,Chen, M.,Tong, YJ.,Ji, T.,Zhu, HC.,...&Xiao, TQ.(2014).Performance of the infrared microspectroscopy station at SSRF.INFRARED PHYSICS & TECHNOLOGY,67,521—525. |
| MLA | Zhang, ZY,et al."Performance of the infrared microspectroscopy station at SSRF".INFRARED PHYSICS & TECHNOLOGY 67(2014):521—525. |
入库方式： OAI收割
来源：上海应用物理研究所
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