Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets
文献类型：期刊论文
| 作者 | Shen, Y ; Wang, Y ; Zhang, JJ ; Hai, CX ; Zhou, Y ; Hu, J ; Zhang, Y |
| 刊名 | JOURNAL OF APPLIED PHYSICS
 |
| 出版日期 | 2014 |
| 卷号 | 115期号:24 |
| 关键词 | WETTING PROPERTIES GRAPHITE OXIDE WATER GLYCEROL CONDENSATION LIQUIDS SINGLE MICA |
| ISSN号 | 0021-8979 |
| 通讯作者 | zhangyi@sinap.ac.cn |
| 英文摘要 | A unique operation mode of scanning polarization force microscopy (SPFM) was developed for characterizing reduced graphene oxide (rGO) sheets that were individually charged, mainly by monitoring the change of the sample's apparent height along with its surface potential. The principles and features of this sample-charged mode SPFM (SC-SPFM) were introduced. By comparing with other scanning-probe based techniques that characterize the surface electrical properties, including the traditional tip-biased mode SPFM, electrostatic force microscopy, and Kelvin probe force microscopy, it was found that the SC-SPFM has higher sensitivity and lateral resolution. Furthermore, by monitoring charge transfer between two rGO sheets with SC-SPFM, the "good"or "bad"contacts related to junction geometry at the nanometer scale can be visualized clearly. (C) 2014 AIP Publishing LLC. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000338633600035 |
| 公开日期 | 2015-03-13 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/14374]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 推荐引用方式 GB/T 7714 | Shen, Y,Wang, Y,Zhang, JJ,et al. Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets[J]. JOURNAL OF APPLIED PHYSICS,2014,115(24). |
| APA | Shen, Y.,Wang, Y.,Zhang, JJ.,Hai, CX.,Zhou, Y.,...&Zhang, Y.(2014).Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets.JOURNAL OF APPLIED PHYSICS,115(24). |
| MLA | Shen, Y,et al."Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets".JOURNAL OF APPLIED PHYSICS 115.24(2014). |
入库方式： OAI收割
来源：上海应用物理研究所
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