中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
An alternative method for data analysis in serial femtosecond crystallography

文献类型:期刊论文

作者Zhang, T ; Li, Y ; Wu, LJ
刊名ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
出版日期2014
卷号70页码:670
ISSN号0108-7673
关键词serial femtosecond crystallography SFX free-electron lasers structure analysis
通讯作者Zhang, T (reprint author), Chinese Acad Sci, Inst Phys, CAS Key Lab Soft Matter Phys, 8,South 3rd St Zhong Guan Cun, Beijing 100190, Peoples R China.
中文摘要Serial femtosecond crystallography (SFX) [Chapman et al. (2011), Nature, 470, 73-77], based on the X-ray free-electron laser, is a new and powerful tool for structure analysis at atomic resolution. This study proposes an extrapolation method for diffraction data analysis on the basis of diffraction intensity distribution in reciprocal space. Results show that this new method can restore SFX simulation data to structure factors that are more consistent with the structures used in simulation.
资助信息National Natural Science Foundation of China [11204364]
语种英语
公开日期2015-04-14
源URL[http://ir.iphy.ac.cn/handle/311004/58799]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Zhang, T,Li, Y,Wu, LJ. An alternative method for data analysis in serial femtosecond crystallography[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,2014,70:670.
APA Zhang, T,Li, Y,&Wu, LJ.(2014).An alternative method for data analysis in serial femtosecond crystallography.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,70,670.
MLA Zhang, T,et al."An alternative method for data analysis in serial femtosecond crystallography".ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 70(2014):670.

入库方式: OAI收割

来源:物理研究所

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