Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy
文献类型：期刊论文
| 作者 | Ge, BH ; Wang, YM ; Chang, YJ ; Yao, Y |
| 刊名 | MICROSCOPY AND MICROANALYSIS
 |
| 出版日期 | 2014 |
| 卷号 | 20期号:5页码:1447 |
| 关键词 | point spread peak width aberration-corrected transmission electron microscopy quantitative electron microscopy negative C-s imaging positive C-s imaging |
| ISSN号 | 1431-9276 |
| 通讯作者 | Ge, BH (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | High precision determination of atomic position is necessary for quantitative electron microscopy so that small width of peaks, which represent atoms in structural images, adequate resolution, and sufficiently strong image contrast are needed. The width of peak is usually determined by the point spread (PS) of instruments, but the PS of objects should also be taken into consideration in aberration-corrected transmission electron microscopy when point resolution of a microscope reaches the sub-angstrom scale, and thus the PS of the instrument is comparable with that of the object. In this article, PS is investigated by studying peak width with variation of atomic number, sample thickness, and spherical aberration coefficients in both negative C-s (NCSI) and positive C-s imaging (PCSI) modes by means of dynamical image simulation. Through comparing the peak width with various atomic number, thickness, and values of spherical aberration, NCSI mode is found to be superior to PCSI considering the smaller width. |
| 资助信息 | National Natural Science Foundation of China [51102275, 10874207, 11104327] |
| 语种 | 英语 |
| 公开日期 | 2015-04-14 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/59327]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Ge, BH,Wang, YM,Chang, YJ,et al. Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy[J]. MICROSCOPY AND MICROANALYSIS,2014,20(5):1447. |
| APA | Ge, BH,Wang, YM,Chang, YJ,&Yao, Y.(2014).Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy.MICROSCOPY AND MICROANALYSIS,20(5),1447. |
| MLA | Ge, BH,et al."Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy".MICROSCOPY AND MICROANALYSIS 20.5(2014):1447. |
入库方式： OAI收割
来源：物理研究所
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