Nanogaps for SERS applications
文献类型：期刊论文
| 作者 | Tong, LM ; Xu, HX ; Kall, M |
| 刊名 | MRS BULLETIN
 |
| 出版日期 | 2014 |
| 卷号 | 39期号:2页码:163 |
| ISSN号 | 0883-7694 |
| 通讯作者 | Tong, LM (reprint author), Chinese Acad Sci, Inst Phys, Nanoscale Phys & Devices Lab, Beijing 100864, Peoples R China. |
| 中文摘要 | The nanogap is possibly the single most important physical entity in surface-enhanced Raman scattering. Nanogaps between noble metal nanostructures deliver extremely high electric field-enhancement, resulting in an extraordinary amplification of both the excitation rate and the emission rate of Raman active molecules situated in the gap. In some cases, the resulting surface-enhancement in the gap can be so high that Raman spectra from single molecules can be measured. Here, we briefly review some important concepts and experimental results on nanoscale gaps for SERS applications. |
| 语种 | 英语 |
| 公开日期 | 2015-04-14 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/59333]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Tong, LM,Xu, HX,Kall, M. Nanogaps for SERS applications[J]. MRS BULLETIN,2014,39(2):163. |
| APA | Tong, LM,Xu, HX,&Kall, M.(2014).Nanogaps for SERS applications.MRS BULLETIN,39(2),163. |
| MLA | Tong, LM,et al."Nanogaps for SERS applications".MRS BULLETIN 39.2(2014):163. |
入库方式： OAI收割
来源：物理研究所
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