In-situ TEM imaging of the anisotropic etching of graphene by metal nanoparticles
文献类型：期刊论文
| 作者 | Wei, JK ; Xu, Z ; Wang, H ; Tian, XZ ; Yang, SZ ; Wang, LF ; Wang, WL ; Bai, XD |
| 刊名 | NANOTECHNOLOGY
 |
| 出版日期 | 2014 |
| 卷号 | 25期号:46 |
| ISSN号 | 0957-4484 |
| 关键词 | graphene nanoribbons anisotropic catalytic etching in-situ electron microscopy graphene |
| 通讯作者 | Wei, JK (reprint author), Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | Few-layer graphene was successfully tailored with smooth edges along crystallographic directions by Joule heating-driven tungsten nanoparticles inside a transmission electron microscope. The dynamic process was monitored in real time at the atomic resolution level. These high-resolution in-situ observations show that the neighboring graphene layers joined together to form closed edges, which is in contrast to the supposed open edges formed with hydrogen passivation. The tungsten nanoparticles transformed to W2C in the intermediate stage of etching and to WC after etching, suggesting that carbon dissolution helped the continuous action of the metal nanoparticles in the catalytic anisotropic etching reaction. |
| 资助信息 | 973 projects from Ministry of Science and Technology [2012CB933003, 2013CB93200]; Natural Science Foundation [11474337, 11004230, 21322304, 11290161]; Chinese Academy of Sciences of china [XDB07030100] |
| 语种 | 英语 |
| 公开日期 | 2015-04-14 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/59368]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wei, JK,Xu, Z,Wang, H,et al. In-situ TEM imaging of the anisotropic etching of graphene by metal nanoparticles[J]. NANOTECHNOLOGY,2014,25(46). |
| APA | Wei, JK.,Xu, Z.,Wang, H.,Tian, XZ.,Yang, SZ.,...&Bai, XD.(2014).In-situ TEM imaging of the anisotropic etching of graphene by metal nanoparticles.NANOTECHNOLOGY,25(46). |
| MLA | Wei, JK,et al."In-situ TEM imaging of the anisotropic etching of graphene by metal nanoparticles".NANOTECHNOLOGY 25.46(2014). |
入库方式： OAI收割
来源：物理研究所
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