中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy

文献类型:期刊论文

作者Yan, CH ; Guo, H ; Wen, J ; Zhang, ZD ; Wang, LL ; He, K ; Ma, XC ; Ji, SH ; Chen, X ; Xue, QK
刊名SURFACE SCIENCE
出版日期2014
卷号621页码:104
ISSN号0039-6028
关键词Topological crystalline insulator Electronic structure Molecular beam epitaxy Scanning tunneling microscopy Angle-resolved photoemission spectroscopy
通讯作者Chen, X (reprint author), Tsinghua Univ, Dept Phys, State Key Lab Low Dimens Quantum Phys, Beijing 100084, Peoples R China.
中文摘要We present the growth of atomically flat topological crystalline insulator (TCI) SnTe films on Si(111) substrate by molecular beam epitaxy (MBE). The growth condition for achieving high quality SnTe film was established by a combination of reflection high energy electron diffraction (RI-TEED) and scanning tunneling microscopy (STM) studies. In-situ angle resolved photoemission spectroscopy (ARPES) measurements elucidate the topological nature of the SnTe films. The electronic structure of SnTe films can be tuned by film thickness and Pb doping. The success in growing high quality SnTe thin films with tunable electronic structure is crucial for potential device applications. (C) 2013 Elsevier B.V. All rights reserved.
资助信息NSFC [11025419, 51331006]; MOST [2011CB921904]
语种英语
公开日期2015-04-14
源URL[http://ir.iphy.ac.cn/handle/311004/59763]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Yan, CH,Guo, H,Wen, J,et al. Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy[J]. SURFACE SCIENCE,2014,621:104.
APA Yan, CH.,Guo, H.,Wen, J.,Zhang, ZD.,Wang, LL.,...&Xue, QK.(2014).Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy.SURFACE SCIENCE,621,104.
MLA Yan, CH,et al."Growth of topological crystalline insulator SnTe thin films on Si(111). substrate by molecular beam epitaxy".SURFACE SCIENCE 621(2014):104.

入库方式: OAI收割

来源:物理研究所

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