Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer
文献类型:期刊论文
作者 | Zhang, Chunmin1,2; Ren, Wenyi1,2,3; Mu, Tingkui1,2; Fu, Lili1,3; Jia, Chenling1,2 |
刊名 | optics express
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出版日期 | 2013-02-11 |
卷号 | 21期号:3页码:2592-2605 |
英文摘要 | based on empirical mode decomposition (emd), the background removal and de-noising procedures of the data taken by polarization interference imaging interferometer (piis) are implemented. through numerical simulation, it is discovered that the data processing methods are effective. the assumption that the noise mostly exists in the first intrinsic mode function is verified, and the parameters in the emd thresholding de-noising methods is determined. in comparison, the wavelet and windowed fourier transform based thresholding de-noising methods are introduced. the de-noised results are evaluated by the snr, spectral resolution and peak value of the de-noised spectrums. all the methods are used to suppress the effect from the gaussian and poisson noise. the de-noising efficiency is higher for the spectrum contaminated by gaussian noise. the interferogram obtained by the piis is processed by the proposed methods. both the interferogram without background and noise free spectrum are obtained effectively. the adaptive and robust emd based methods are effective to the background removal and de-noising in piis. (c) 2013 optical society of america |
WOS标题词 | science & technology ; physical sciences |
类目[WOS] | optics |
研究领域[WOS] | optics |
关键词[WOS] | hilbert spectrum ; difference ; view |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000315991400006 |
公开日期 | 2015-06-30 |
源URL | [http://ir.opt.ac.cn/handle/181661/23462] ![]() |
专题 | 西安光学精密机械研究所_研究生部 |
作者单位 | 1.Xi An Jiao Tong Univ, Sch Sci, Xian 710049, Peoples R China 2.Minist Educ, Key Lab, Nonequilibrium Condensed Matter & Quantum Engn La, Xian 710049, Peoples R China 3.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, Chunmin,Ren, Wenyi,Mu, Tingkui,et al. Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer[J]. optics express,2013,21(3):2592-2605. |
APA | Zhang, Chunmin,Ren, Wenyi,Mu, Tingkui,Fu, Lili,&Jia, Chenling.(2013).Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer.optics express,21(3),2592-2605. |
MLA | Zhang, Chunmin,et al."Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer".optics express 21.3(2013):2592-2605. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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