Microstructural evolution of the interfacial layer in the Ti-Al/Yb0.6Co4Sb12 thermoelectric joints at high temperature
文献类型:期刊论文
作者 | Gu M(顾明); Xia XG(夏绪贵); Li XY(李小亚); Huang XY(黄向阳); Chen LD(陈立东) |
刊名 | J. Alloys Compd
![]() |
出版日期 | 2014 |
期号 | 610页码:665 |
学科主题 | 无机非金属材料 |
语种 | 英语 |
WOS记录号 | WOS:000338811100102 |
源URL | [http://ir.sic.ac.cn/handle/331005/5910] ![]() |
专题 | 上海硅酸盐研究所_能量转换材料重点实验室_期刊论文 |
推荐引用方式 GB/T 7714 | Gu M,Xia XG,Li XY,et al. Microstructural evolution of the interfacial layer in the Ti-Al/Yb0.6Co4Sb12 thermoelectric joints at high temperature[J]. J. Alloys Compd,2014(610):665. |
APA | Gu M,Xia XG,Li XY,Huang XY,&Chen LD.(2014).Microstructural evolution of the interfacial layer in the Ti-Al/Yb0.6Co4Sb12 thermoelectric joints at high temperature.J. Alloys Compd(610),665. |
MLA | Gu M,et al."Microstructural evolution of the interfacial layer in the Ti-Al/Yb0.6Co4Sb12 thermoelectric joints at high temperature".J. Alloys Compd .610(2014):665. |
入库方式: OAI收割
来源:上海硅酸盐研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。