Glancing-incidence X-ray analysis of ZnO thin films and ZnO/ZnMgO hetero structures grown by laser-MBE
文献类型：期刊论文
| 作者 | Yang, XD; Zhang, JW; Bi, Z; He, YN; Xu, Q; Wang, HB; Zhang, WF; Hou, X |
| 刊名 | journal of crystal growth
 |
| 出版日期 | 2005-10-15 |
| 卷号 | 284期号:1-2页码:123-128 |
| 关键词 | glancing incidence X-ray analysis time-integrated photoluminescence X-ray reflectivity laser MBE |
| 英文摘要 | in this paper, we report on glancing-incidence x-ray analysis (gixa) of zno thin films, zno/znmgo and zno/au heterostructures grown by laser molecular beam epitaxy (l-mbe) on c-plane al2o3 substrates. the surface and interface sensitivity of x-ray reflectivity (xrr) has been exploited to evaluate the surfaces and interfaces of zno-based structures. the presence of smooth interfaces is responsible for the observation of intensity oscillation in xrr, which is well correlated to the clear pendellosung fringes in high-resolution x-ray diffraction (hrxrd) measurements. in addition, the simulation of xrr data yields reliable and precise information of the layer thickness, the surface and interface roughness of each layer. the correlation of a smooth surface and high optical and structural quality is substantiated by time-integrated photoluminescence (tipl) and xrd measurements of zno/znmgo heterostructure and zno thin films. the intense exciton-related emission, in contrast to a negligible deep-level radiation and the high c-axis orientation of zno films, indicates good optical and structural properties due to the superior surface and interface quality of our samples. (c) 2005 elsevier b.v. all rights reserved. |
| WOS标题词 | science & technology ; physical sciences ; technology |
| 类目[WOS] | crystallography ; materials science, multidisciplinary ; physics, applied |
| 研究领域[WOS] | crystallography ; materials science ; physics |
| 关键词[WOS] | molecular-beam epitaxy ; room-temperature ; sapphire ; surface ; reflectivity ; interface ; layer ; gan |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000232387900017 |
| 公开日期 | 2015-08-18 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/25127]  |
| 专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
| 作者单位 | 1.Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710049, Shaanxi Prov, Peoples R China 2.Xian Jiaotong Univ, Key Lab Photon Technol Informat, Xian 710049, Peoples R China 3.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China 4.Henan Univ, Sch Phys & Photoelect, Kaifeng 475000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yang, XD,Zhang, JW,Bi, Z,et al. Glancing-incidence X-ray analysis of ZnO thin films and ZnO/ZnMgO hetero structures grown by laser-MBE[J]. journal of crystal growth,2005,284(1-2):123-128. |
| APA | Yang, XD.,Zhang, JW.,Bi, Z.,He, YN.,Xu, Q.,...&Hou, X.(2005).Glancing-incidence X-ray analysis of ZnO thin films and ZnO/ZnMgO hetero structures grown by laser-MBE.journal of crystal growth,284(1-2),123-128. |
| MLA | Yang, XD,et al."Glancing-incidence X-ray analysis of ZnO thin films and ZnO/ZnMgO hetero structures grown by laser-MBE".journal of crystal growth 284.1-2(2005):123-128. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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