Investigation of the influence of the aberration induced by a plane interface on STED microscopy
文献类型：期刊论文
| 作者 | Deng Suhui ; Liu Li ; Cheng Y(程亚) ; Li RX(李儒新) ; Xu ZZ(徐至展) |
| 刊名 | opt. express
 |
| 出版日期 | 2009 |
| 卷号 | 17期号:3页码:1714 |
| 关键词 | DEPLETION FLUORESCENCE MICROSCOPY DIFFRACTION RESOLUTION LIMIT LAGUERRE-GAUSSIAN BEAMS ELECTROMAGNETIC DIFFRACTION INTEGRAL-REPRESENTATION STIMULATED-EMISSION OPTICAL SYSTEMS IMAGE FIELD FREE-SPACE POLARIZATION |
| ISSN号 | 1094-4087 |
| 中文摘要 | the structure of the inhibition patterns is important to the stimulated emission depletion (sted) microscopy. usually, laguerre-gaussian (lg) beam and the central zero-intensity patterns created by inserting phase masks in gaussian beams are used as the erase beam in sted microscopy. aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. by use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the sted microscopy are studied. results are presented as a comparison between the aberration-free case and the aberrated cases. (c) 2009 optical society of america |
| 学科主题 | 激光技术;激光物理与基本理论 |
| 资助信息 | national natural science [60527004] |
| 语种 | 英语 |
| 公开日期 | 2009-09-18 ; 2010-10-12 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/654]  |
| 专题 | 上海光学精密机械研究所_强场激光物理国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Deng Suhui,Liu Li,Cheng Y,et al. Investigation of the influence of the aberration induced by a plane interface on STED microscopy[J]. opt. express,2009,17(3):1714, 1725. |
| APA | Deng Suhui,Liu Li,程亚,李儒新,&徐至展.(2009).Investigation of the influence of the aberration induced by a plane interface on STED microscopy.opt. express,17(3),1714. |
| MLA | Deng Suhui,et al."Investigation of the influence of the aberration induced by a plane interface on STED microscopy".opt. express 17.3(2009):1714. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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