SLD: A Novel Robust Descriptor for Image Matching
文献类型：期刊论文
| 作者 | Zhou, Wen; Wang, Chunheng ; Xiao, Baihua; Zhang, Zhong
|
| 刊名 | IEEE SIGNAL PROCESSING LETTERS
 |
| 出版日期 | 2014-03-01 |
| 卷号 | 21期号:3页码:339-342 |
| 关键词 | Elliptical sampling image matching robustness sampling based local descriptor viewpoints |
| 英文摘要 | Image matching based on local features is a challenging task because it is difficult to build a robust local descriptor which is invariant to large variations in scale, viewpoints, illumination and rotation. To address these issues, Scale Invariant Feature Transform (SIFT) descriptor has been proposed to build a robust and distinctive local descriptor. However, it is not fully affine invariant. In this letter, we propose a novel robust descriptor: Sampling based Local Descriptor (SLD) to perform reliable image matching under large variations in scale, viewpoints, illumination and rotation. We build the descriptor based on elliptical sampling which samples image pixels according to the elliptic equations. The main advantage of elliptical sampling is that two controllable parameters of elliptical sampling can generate descriptors with different viewpoints and rotations. Besides, the descriptor has two notable properties: 1) it is fully invariant to affine changes; 2) it enables fast matching process because we only need to search two controllable parameters for elliptical sampling, which is more efficient than other affine invariant descriptors. We test the proposed descriptor on standard benchmark for evaluation. Experimental results show the robustness of the proposed method under large variations in illumination, viewpoints and scale. |
| WOS标题词 | Science & Technology ; Technology |
| 类目[WOS] | Engineering, Electrical & Electronic |
| 研究领域[WOS] | Engineering |
| 关键词[WOS] | INVARIANT ; DETECTORS ; FEATURES ; SCALE |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000331297400002 |
| 源URL | [http://ir.ia.ac.cn/handle/173211/3742]  |
| 专题 | 自动化研究所_复杂系统管理与控制国家重点实验室_影像分析与机器视觉团队 |
| 作者单位 | Chinese Acad Sci, State Key Lab Management & Control Complex Syst, Inst Automat, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhou, Wen,Wang, Chunheng,Xiao, Baihua,et al. SLD: A Novel Robust Descriptor for Image Matching[J]. IEEE SIGNAL PROCESSING LETTERS,2014,21(3):339-342. |
| APA | Zhou, Wen,Wang, Chunheng,Xiao, Baihua,&Zhang, Zhong.(2014).SLD: A Novel Robust Descriptor for Image Matching.IEEE SIGNAL PROCESSING LETTERS,21(3),339-342. |
| MLA | Zhou, Wen,et al."SLD: A Novel Robust Descriptor for Image Matching".IEEE SIGNAL PROCESSING LETTERS 21.3(2014):339-342. |
入库方式： OAI收割
来源：自动化研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。