Nonlinear Metric Learning with Deep Independent Subspace Analysis Network for Face Verification
文献类型：期刊论文
| 作者 | Cai, Xinyuan ; Wang, Chunheng; Xiao, Baihua; Shao, Yunxue
|
| 刊名 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
 |
| 出版日期 | 2013-12-01 |
| 卷号 | E96D期号:12页码:2830-2838 |
| 关键词 | metric learning independent subspace analysis deep learning architecture face verification |
| 英文摘要 | Face verification is the task of determining whether two given face images represent the same person or not. It is a very challenging task, as the face images, captured in the uncontrolled environments, may have large variations in illumination, expression, pose, background, etc. The crucial problem is how to compute the similarity of two face images. Metric learning has provided a viable solution to this problem. Until now, many metric learning algorithms have been propos'ed, but they are usually limited to learning a linear transformation In this paper, we propose a nonlinear metric learning method, which learns an explicit mapping from the original space to an optimal subspace using deep Independent Subspace Analysis (ISA) network. Compared to the linear or kernel based metric learning methods, the proposed deep ISA network is a deep and local learning architecture, and therefore exhibits more powerful ability to learn the nature of highly variable dataset. We evaluate our method on the Labeled Faces in the Wild dataset, and results show superior performance over some state-of-the-art methods. |
| WOS标题词 | Science & Technology ; Technology |
| 类目[WOS] | Computer Science, Information Systems ; Computer Science, Software Engineering |
| 研究领域[WOS] | Computer Science |
| 关键词[WOS] | DIMENSIONALITY REDUCTION ; RECOGNITION ; PATTERNS |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000329009300036 |
| 源URL | [http://ir.ia.ac.cn/handle/173211/3751]  |
| 专题 | 自动化研究所_复杂系统管理与控制国家重点实验室_影像分析与机器视觉团队 |
| 作者单位 | Chinese Acad Sci, State Key Lab Management & Control Complex Syst, Inst Automat, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Cai, Xinyuan,Wang, Chunheng,Xiao, Baihua,et al. Nonlinear Metric Learning with Deep Independent Subspace Analysis Network for Face Verification[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2013,E96D(12):2830-2838. |
| APA | Cai, Xinyuan,Wang, Chunheng,Xiao, Baihua,&Shao, Yunxue.(2013).Nonlinear Metric Learning with Deep Independent Subspace Analysis Network for Face Verification.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E96D(12),2830-2838. |
| MLA | Cai, Xinyuan,et al."Nonlinear Metric Learning with Deep Independent Subspace Analysis Network for Face Verification".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E96D.12(2013):2830-2838. |
入库方式： OAI收割
来源：自动化研究所
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