Properties of photon counting imaging system with Si thin films
文献类型：期刊论文
| 作者 | Zhao Fei-Fei1,2; Liu Yong-An1 ; Hu Hui-Jun1,2; Zhao Bao-Sheng1
|
| 刊名 | acta physica sinica
 |
| 出版日期 | 2010-10-01 |
| 卷号 | 59期号:10页码:7096-7104 |
| 关键词 | detectors photon counting imaging charge induction microchannel plate |
| 英文摘要 | the si thin films on ceramic substrates,which were fabricated by electron beam evaporation, were applied as charge induction layers in photon counting imaging system with induction readout. the structures and micrograph of si thin films were studied. the x-ray diffraction (xrd) analysis and field emission scanning electron microscopy (fesem) images indicate that the thin film has amorphous structure and is coarse due to the lattice boundary of ceramic substrate. the experimental setup was established and the detector resolution, counting rate, pulse height distribution curves etc., with different si film thickness were compared. the results suggest that the film thickness influences on spatial resolution less than on the counting rate. moreover, the properties of the system with si and ge thin films of the same resistance were compared,which shows that the properties such as distortion,counting rate and dark count rate are better with the si films. |
| WOS标题词 | science & technology ; physical sciences |
| 类目[WOS] | physics, multidisciplinary |
| 研究领域[WOS] | physics |
| 关键词[WOS] | detector |
| 收录类别 | SCI |
| 语种 | 中文 |
| WOS记录号 | WOS:000283406400059 |
| 公开日期 | 2015-09-15 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/25268]  |
| 专题 | 西安光学精密机械研究所_光电子学研究室 |
| 作者单位 | 1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhao Fei-Fei,Liu Yong-An,Hu Hui-Jun,et al. Properties of photon counting imaging system with Si thin films[J]. acta physica sinica,2010,59(10):7096-7104. |
| APA | Zhao Fei-Fei,Liu Yong-An,Hu Hui-Jun,&Zhao Bao-Sheng.(2010).Properties of photon counting imaging system with Si thin films.acta physica sinica,59(10),7096-7104. |
| MLA | Zhao Fei-Fei,et al."Properties of photon counting imaging system with Si thin films".acta physica sinica 59.10(2010):7096-7104. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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