中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Properties of photon counting imaging system with Si thin films

文献类型:期刊论文

作者Zhao Fei-Fei1,2; Liu Yong-An1; Hu Hui-Jun1,2; Zhao Bao-Sheng1
刊名acta physica sinica
出版日期2010-10-01
卷号59期号:10页码:7096-7104
关键词detectors photon counting imaging charge induction microchannel plate
英文摘要the si thin films on ceramic substrates,which were fabricated by electron beam evaporation, were applied as charge induction layers in photon counting imaging system with induction readout. the structures and micrograph of si thin films were studied. the x-ray diffraction (xrd) analysis and field emission scanning electron microscopy (fesem) images indicate that the thin film has amorphous structure and is coarse due to the lattice boundary of ceramic substrate. the experimental setup was established and the detector resolution, counting rate, pulse height distribution curves etc., with different si film thickness were compared. the results suggest that the film thickness influences on spatial resolution less than on the counting rate. moreover, the properties of the system with si and ge thin films of the same resistance were compared,which shows that the properties such as distortion,counting rate and dark count rate are better with the si films.
WOS标题词science & technology ; physical sciences
类目[WOS]physics, multidisciplinary
研究领域[WOS]physics
关键词[WOS]detector
收录类别SCI
语种中文
WOS记录号WOS:000283406400059
公开日期2015-09-15
源URL[http://ir.opt.ac.cn/handle/181661/25268]  
专题西安光学精密机械研究所_光电子学研究室
作者单位1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
推荐引用方式
GB/T 7714
Zhao Fei-Fei,Liu Yong-An,Hu Hui-Jun,et al. Properties of photon counting imaging system with Si thin films[J]. acta physica sinica,2010,59(10):7096-7104.
APA Zhao Fei-Fei,Liu Yong-An,Hu Hui-Jun,&Zhao Bao-Sheng.(2010).Properties of photon counting imaging system with Si thin films.acta physica sinica,59(10),7096-7104.
MLA Zhao Fei-Fei,et al."Properties of photon counting imaging system with Si thin films".acta physica sinica 59.10(2010):7096-7104.

入库方式: OAI收割

来源:西安光学精密机械研究所

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