A matching algorithm based on local topologic structure
文献类型:期刊论文
作者 | Chen, XJ; Tian, J![]() ![]() |
刊名 | IMAGE ANALYSIS AND RECOGNITION, PT 1, PROCEEDINGS
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出版日期 | 2004 |
卷号 | 3211页码:360-367 |
英文摘要 | How to cope with non-linear distortions in the matching algorithm is a real challenge. In this paper, we proposed a novel fingerprint matching algorithm based on the local topologic structure and a novel method to compute the similarity between two fingerprints. The algorithm firstly aligns the template fingerprint and the input fingerprint. Then local topologic structure matching was introduced to improve the robustness of global alignment. Finally a novel method was introduced to compute the similarity between the template fingerprint and the input fingerprint. The proposed algorithm has been participated in Fingerprint verification competition (FVC2004). The performance was ranked 3(rd) position in open category in FVC2004. |
WOS标题词 | Science & Technology ; Technology |
类目[WOS] | Computer Science, Artificial Intelligence ; Computer Science, Theory & Methods ; Imaging Science & Photographic Technology |
研究领域[WOS] | Computer Science ; Imaging Science & Photographic Technology |
收录类别 | ISTP ; SCI |
语种 | 英语 |
WOS记录号 | WOS:000224667000045 |
公开日期 | 2015-09-22 |
源URL | [http://ir.ia.ac.cn/handle/173211/7984] ![]() |
专题 | 自动化研究所_中国科学院分子影像重点实验室 |
通讯作者 | Tian, Jie |
作者单位 | Chinese Acad Sci, Grad Sch, Inst Automat, Kay Lab Complex Syst & Intelligent Sci,Biometr Re, Beijing 100080, Peoples R China |
推荐引用方式 GB/T 7714 | Chen, XJ,Tian, J,Yang, X,et al. A matching algorithm based on local topologic structure[J]. IMAGE ANALYSIS AND RECOGNITION, PT 1, PROCEEDINGS,2004,3211:360-367. |
APA | Chen, XJ,Tian, J,Yang, X,Campilho, A,Kamel, M,&Tian, Jie.(2004).A matching algorithm based on local topologic structure.IMAGE ANALYSIS AND RECOGNITION, PT 1, PROCEEDINGS,3211,360-367. |
MLA | Chen, XJ,et al."A matching algorithm based on local topologic structure".IMAGE ANALYSIS AND RECOGNITION, PT 1, PROCEEDINGS 3211(2004):360-367. |
入库方式: OAI收割
来源:自动化研究所
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