A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance
文献类型：期刊论文
| 作者 | Sun, Yujing ; Wen, Zhiwei ; Xu, Fugang ; Zhang,Yue ; Shi,Yan ; Dai,Haichao ; Li,Zhuang |
| 刊名 | analytical methods
 |
| 出版日期 | 2014 |
| 卷号 | 6期号:2页码:337-340 |
| 关键词 | METAL-FILMS THIN CONDUCTIVITY ULTRATHIN COALESCENCE RESISTIVITY |
| 通讯作者 | li,z |
| 英文摘要 | in this report, it was found that the napierian logarithm of the electrical resistance is proportional to the reciprocal thickness for the platinum nanofilms. a new method was proposed to determine the thickness of platinum nanofilm simply by measuring its electrical resistance, which is fast and cost effective. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000329072200001 |
| 源URL | [http://ir.ciac.jl.cn/handle/322003/57472]  |
| 专题 | 长春应用化学研究所_长春应用化学研究所知识产出_期刊论文 |
| 推荐引用方式 GB/T 7714 | Sun, Yujing,Wen, Zhiwei,Xu, Fugang,et al. A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance[J]. analytical methods,2014,6(2):337-340. |
| APA | Sun, Yujing.,Wen, Zhiwei.,Xu, Fugang.,Zhang,Yue.,Shi,Yan.,...&Li,Zhuang.(2014).A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance.analytical methods,6(2),337-340. |
| MLA | Sun, Yujing,et al."A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance".analytical methods 6.2(2014):337-340. |
入库方式： OAI收割
来源：长春应用化学研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。