Generation of multiple charged ions: Photoemission electron impact ionization
文献类型:期刊论文
作者 | Wang, L; Li, HY; Bai, JL; Lu, RC |
刊名 | science in china series b-chemistry
![]() |
出版日期 | 1998-10-01 |
卷号 | 41期号:5页码:525-534 |
关键词 | multiple charged ions photoemission electron electron impact ionization time-of-flight mass spectrometer |
英文摘要 | delayed pulsed electric field was used to investigate the generation mechanism of multiple charged ions produced in the interaction of laser, metal surface and electric field on time-of-flight mass spectrometer (tof ms). a special photoelectron generator was designed to control the energy and timing of the photoelectron beam. this modification made it possible to separate the photoionization process from photoelectron impact ionization. the experiment showed that the multiple charged ions could be produced only by the photoelectron impact, ionized step by step. a design of dual ionization configuration was presented, which could be used to study either multiphoton ionization or photoemission electron impact ionization. |
WOS标题词 | science & technology ; physical sciences |
类目[WOS] | chemistry, multidisciplinary |
研究领域[WOS] | chemistry |
关键词[WOS] | flight mass-spectrometer |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000076532000011 |
公开日期 | 2015-11-10 |
源URL | [http://159.226.238.44/handle/321008/138138] ![]() |
专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
作者单位 | Dalian Inst Chem Phys, State Key Lab Mol React Dynam, Dalian 116023, Peoples R China |
推荐引用方式 GB/T 7714 | Wang, L,Li, HY,Bai, JL,et al. Generation of multiple charged ions: Photoemission electron impact ionization[J]. science in china series b-chemistry,1998,41(5):525-534. |
APA | Wang, L,Li, HY,Bai, JL,&Lu, RC.(1998).Generation of multiple charged ions: Photoemission electron impact ionization.science in china series b-chemistry,41(5),525-534. |
MLA | Wang, L,et al."Generation of multiple charged ions: Photoemission electron impact ionization".science in china series b-chemistry 41.5(1998):525-534. |
入库方式: OAI收割
来源:大连化学物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。