中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Wide-field-of-view polarization interference imaging spectrometer

文献类型:期刊论文

作者Zhang, CM; Zhao, BC; Bin, XL
刊名applied optics
出版日期2004-11-20
卷号43期号:33页码:6090-6094
英文摘要a wide-field-of-view polarization interference imaging spectrometer (wpiis) based on a modified savart polariscope, without moving parts, and with a narrow slit has been designed. the primary feature of this device is for use with a large angle of incidence, and the target image as well as the interferogram can be obtained at the same time in the spatial domain and are recorded by a two-dimensional ccd camera. under compensation, the field of view of the wpiis will extend 3-5 times as large as a common interference imaging spectrometer, and throughput will raise 1-2 orders of magnitude. the developed optics is 20 x 8 cm circle divide in size. the spectral resolution of the prototype system is 86.8 cm(-1) between 22222.2 and 11111.1 cm(-1). this system has the advantages of being static and ultracompact with wide field of view and a very high throughput. the optics system and especially the wide-field-of-view compensation principle are described, and the experimental result of the interference imaging spectrum is shown. (c) 2004 optical society of america.
WOS标题词science & technology ; physical sciences
类目[WOS]optics
研究领域[WOS]optics
关键词[WOS]transform ; interferometer
收录类别SCI ; EI
语种英语
WOS记录号WOS:000225531600004
公开日期2015-11-17
源URL[http://ir.opt.ac.cn/handle/181661/25469]  
专题西安光学精密机械研究所_中国科学院西安光学精密机械研究所(2010年前)
作者单位1.Xi An Jiao Tong Univ, Sch Sci, Xian 710049, Peoples R China
2.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710068, Peoples R China
推荐引用方式
GB/T 7714
Zhang, CM,Zhao, BC,Bin, XL. Wide-field-of-view polarization interference imaging spectrometer[J]. applied optics,2004,43(33):6090-6094.
APA Zhang, CM,Zhao, BC,&Bin, XL.(2004).Wide-field-of-view polarization interference imaging spectrometer.applied optics,43(33),6090-6094.
MLA Zhang, CM,et al."Wide-field-of-view polarization interference imaging spectrometer".applied optics 43.33(2004):6090-6094.

入库方式: OAI收割

来源:西安光学精密机械研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。