中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Ocular Anterior Segment Biometry and High-Order Wavefront Aberrations During Accommodation

文献类型:期刊论文

作者Yuan, Yimin1; Shao, Yilei1; Tao, Aizhu1; Shen, Meixiao1; Wang, Jianhua2; Shi, Guohua3; Chen, Qi1; Zhu, Dexi1; Lian, Yan1; Qu, Jia1
刊名INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE
出版日期2013-10-01
卷号54期号:10页码:7028-7037
关键词accommodation optical coherence tomography aberrations anterior segment crystalline lens pupil
英文摘要PURPOSE. We investigated the relationships between the ocular anterior segment biometry and the ocular high-order aberrations (HOAs) during accommodation by combined ultralong scan depth optical coherence tomography (UL-OCT) and wavefront sensor.
WOS标题词Science & Technology ; Life Sciences & Biomedicine
类目[WOS]Ophthalmology
研究领域[WOS]Ophthalmology
关键词[WOS]OPTICAL COHERENCE TOMOGRAPHY ; ISOLATED CRYSTALLINE LENS ; THE-RULE ASTIGMATISM ; HUMAN EYE ; MONOCHROMATIC ABERRATIONS ; PUPIL SIZE ; AGE ; EMMETROPES ; SENSOR ; DEPTH
收录类别SCI
语种英语
WOS记录号WOS:000326567700066
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/1171]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位1.Wenzhou Med Univ, Sch Ophthalmol & Optometry, Wenzhou 325027, Zhejiang, Peoples R China
2.Univ Miami, Miller Sch Med, Bascom Palmer Eye Inst, Miami, FL 33136 USA
3.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
推荐引用方式
GB/T 7714
Yuan, Yimin,Shao, Yilei,Tao, Aizhu,et al. Ocular Anterior Segment Biometry and High-Order Wavefront Aberrations During Accommodation[J]. INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE,2013,54(10):7028-7037.
APA Yuan, Yimin.,Shao, Yilei.,Tao, Aizhu.,Shen, Meixiao.,Wang, Jianhua.,...&Lu, Fan.(2013).Ocular Anterior Segment Biometry and High-Order Wavefront Aberrations During Accommodation.INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE,54(10),7028-7037.
MLA Yuan, Yimin,et al."Ocular Anterior Segment Biometry and High-Order Wavefront Aberrations During Accommodation".INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE 54.10(2013):7028-7037.

入库方式: OAI收割

来源:光电技术研究所

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