中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Self-imaging generation of plasmonic void arrays

文献类型:期刊论文

作者Wei, Shibiao1; Lin, Jiao2; Wang, Rong1; Wang, Qian3; Yuan, Guanghui3; Du, Luping3; Wang, Yanqin4; Luo, Xiangang4; Hong, Minghui5; Min, Changjun1
刊名OPTICS LETTERS
出版日期2013-08-01
卷号38期号:15页码:2783-2785
英文摘要A plasmonic device is proposed to produce a self-imaging surface plasmon void array (2D surface bottle beam array) by the interference of two nondiffracting surface beams, namely, cosine-Gauss beams. The self-imaging surface voids are shown by full-wave calculations and then verified experimentally with an aperture-type near-field scanning optical microscope. We also demonstrate that the void array can be adjusted with flexibility in terms of the pattern and the number of voids. (C) 2013 Optical Society of America
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]BOTTLE BEAM ; DARK FOCUS ; TRAP
收录类别SCI
语种英语
WOS记录号WOS:000322576200046
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/1177]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位1.Nankai Univ, Inst Modern Opt, Key Lab Opt Informat Sci & Technol, Minist Educ China, Tianjin 300071, Peoples R China
2.Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia
3.Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
4.Chinese Acad Sci, Inst Opt & Elect, State Key Lab Opt Technol Microfabricat, Chengdu 610209, Peoples R China
5.Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore
6.Shenzhen Univ, Inst Micro & Nano Opt, Shenzhen 518060, Peoples R China
推荐引用方式
GB/T 7714
Wei, Shibiao,Lin, Jiao,Wang, Rong,et al. Self-imaging generation of plasmonic void arrays[J]. OPTICS LETTERS,2013,38(15):2783-2785.
APA Wei, Shibiao.,Lin, Jiao.,Wang, Rong.,Wang, Qian.,Yuan, Guanghui.,...&Yuan, Xiaocong.(2013).Self-imaging generation of plasmonic void arrays.OPTICS LETTERS,38(15),2783-2785.
MLA Wei, Shibiao,et al."Self-imaging generation of plasmonic void arrays".OPTICS LETTERS 38.15(2013):2783-2785.

入库方式: OAI收割

来源:光电技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。