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Absolute measurement of optical flats based on basic iterative methods

文献类型：期刊论文

作者Quan, Haiyang1,2; Hou, Xi1; Wu, Fan1; Song, Weihong1
刊名OPTICS EXPRESS
出版日期2015-06-15
卷号23期号:12页码:16305-16319
英文摘要Generalized basic iterative methods for absolute measurement of optical flats are presented. They are based on iterative scheme and can be classified into block Jacobi Successive Over-relaxation (SOR) method and block SOR method. Both methods are effective for solving the three-flat problem with pixel-level spatial resolution, without the usage of a fitting procedure. Compared to the block Jacobi SOR method, the block SOR method with an inexpensive choosing of relaxation factor (such as omega = 1.5) converges much faster and saves more computational costs and memory space without reducing accuracy. It has been proved by both simulation results and experimental results. The proposed basic iterative methods are generalized; can correctly reconstruct absolute figures with pixel-level spatial resolution; are easy to understand and implement; and computationally efficient. (C) 2015 Optical Society of America
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]SHIFT-ROTATION METHOD ; 3-FLAT TEST ; ZERNIKE POLYNOMIALS ; ROOM-TEMPERATURE ; FUSED-SILICA ; CALIBRATION ; ALGORITHM ; PLANARITY
收录类别SCI
语种英语
WOS记录号WOS:000356902500111
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/3229]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位1.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714		 Quan, Haiyang,Hou, Xi,Wu, Fan,et al. Absolute measurement of optical flats based on basic iterative methods[J]. OPTICS EXPRESS,2015,23(12):16305-16319.
APA Quan, Haiyang,Hou, Xi,Wu, Fan,&Song, Weihong.(2015).Absolute measurement of optical flats based on basic iterative methods.OPTICS EXPRESS,23(12),16305-16319.
MLA Quan, Haiyang,et al."Absolute measurement of optical flats based on basic iterative methods".OPTICS EXPRESS 23.12(2015):16305-16319.

入库方式： OAI收割

来源：光电技术研究所

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