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Way of detecting entire beam path aberrations of laser systems based on a phase-retrieval method

文献类型：期刊论文

作者Yang, Ping1; Ao, Mingwu2; Xu, Bing1; Yuan, Xiao3
刊名APPLIED OPTICS
出版日期2009-03-01
卷号48期号:7页码:1402-1407
英文摘要A method is presented to detect entire beam path aberrations of many laser systems, especially the SG-III inertial confinement fusion (ICF) laser system, which is under construction in China. Instead of a Hartman-Shack (HS) sensor, a CCD will be introduced into the target chamber of the ICF laser system. The HS sensor and the CCD could record the near-field wavefront distributions and the intensity signals of their corresponding focal spots, respectively. An amendatory phase-retrieval method is introduced to reconstruct the aberrations of the entire beam path from near-field wavefront distributions and their corresponding focal spots intensity. Principle experimental results indicate that the aberrations of the entire beam path of a laser system can be precisely detected based on this method. (C) 2009 Optical Society of America
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]NATIONAL IGNITION FACILITY
收录类别SCI
语种英语
WOS记录号WOS:000264413600043
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/3250]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位1.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
2.Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu, Peoples R China
3.Huazhong Univ Sci & Technol, Sch Optoelect Sci & Engn, Wuhan 430074, Peoples R China
推荐引用方式
GB/T 7714		 Yang, Ping,Ao, Mingwu,Xu, Bing,et al. Way of detecting entire beam path aberrations of laser systems based on a phase-retrieval method[J]. APPLIED OPTICS,2009,48(7):1402-1407.
APA Yang, Ping,Ao, Mingwu,Xu, Bing,&Yuan, Xiao.(2009).Way of detecting entire beam path aberrations of laser systems based on a phase-retrieval method.APPLIED OPTICS,48(7),1402-1407.
MLA Yang, Ping,et al."Way of detecting entire beam path aberrations of laser systems based on a phase-retrieval method".APPLIED OPTICS 48.7(2009):1402-1407.

入库方式： OAI收割

来源：光电技术研究所

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