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A novel phase measuring deflectometry for aspheric mirror test

文献类型:期刊论文

作者Tang, Yan1; Su, Xianyu1; Wu, Fan2; Liu, Yuankun1
刊名OPTICS EXPRESS
出版日期2009-10-26
卷号17期号:22页码:19778-19784
英文摘要A method based on fringe reflection is presented to measure the aspheric mirror with higher precise. This method measures the absolute height of the aspheric mirror with dummy paraboloid, while the camera is located beside the optical axis of the test surface. It can be used to measure the aspheric mirror with high deviation. And for locating the camera beside the optical axis, this method doesn't have occlusion problem and can do the measurement more flexibility. Furthermore, compared with the traditional PMD, this method measures the tested surface with dummy paraboloid instead of the intersection of two straight lines, so it doesn't need to calibrate the image projection vectors. And the errors of the calibration influence this method less than the traditional method. Therefore, this method can measure the high deviation aspheric mirror with higher precise even if the calibration precise isn't very high. Computer simulations and preliminary experiment validate the feasibility of this method. (C) 2009 Optical Society of America
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]3D SHAPE MEASUREMENT ; SURFACES
收录类别SCI
语种英语
WOS记录号WOS:000271629200046
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/3301]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位1.Sichuan Univ, Dept Optoelect, Chengdu 610064, Peoples R China
2.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
推荐引用方式
GB/T 7714
Tang, Yan,Su, Xianyu,Wu, Fan,et al. A novel phase measuring deflectometry for aspheric mirror test[J]. OPTICS EXPRESS,2009,17(22):19778-19784.
APA Tang, Yan,Su, Xianyu,Wu, Fan,&Liu, Yuankun.(2009).A novel phase measuring deflectometry for aspheric mirror test.OPTICS EXPRESS,17(22),19778-19784.
MLA Tang, Yan,et al."A novel phase measuring deflectometry for aspheric mirror test".OPTICS EXPRESS 17.22(2009):19778-19784.

入库方式: OAI收割

来源:光电技术研究所

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