中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Improving resolution of superlens lithography by phase-shifting mask

文献类型:期刊论文

作者Yao, Na; Lai, Zian; Fang, Liang; Wang, Changtao; Feng, Qin; Zhao, Zheyu; Luo, Xiangang
刊名OPTICS EXPRESS
出版日期2011-08-15
卷号19期号:17页码:15982-15989
英文摘要We propose to apply phase-shifting mask (PSM) to superlens lithography to improve its resolution. The PSM comprises of chromium slits alternatively filled by Ag and PMMA. The pi-phase shift is induced whereas their transmittance of electric intensity is almost equal for two neighboring slits. The destructive interference between two slits has greatly improved the spatial resolution and image fidelity. For representative configurations of superlens lithography, FDTD numerical simulations demonstrate that two slits with center-to-center distance d = 35 nm (similar to lambda/10) can be resolved in PSM design, compared to 60 nm (similar to lambda/6) without the PSM. (C)2011 Optical Society of America
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]SILVER SUPERLENS ; NEAR-FIELD ; DESIGN ; SLAB
收录类别SCI
语种英语
WOS记录号WOS:000293894900036
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/3435]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位Chinese Acad Sci, State Key Lab Opt Technol Microfabricat, Inst Opt & Elect, Chengdu 610209, Peoples R China
推荐引用方式
GB/T 7714
Yao, Na,Lai, Zian,Fang, Liang,et al. Improving resolution of superlens lithography by phase-shifting mask[J]. OPTICS EXPRESS,2011,19(17):15982-15989.
APA Yao, Na.,Lai, Zian.,Fang, Liang.,Wang, Changtao.,Feng, Qin.,...&Luo, Xiangang.(2011).Improving resolution of superlens lithography by phase-shifting mask.OPTICS EXPRESS,19(17),15982-15989.
MLA Yao, Na,et al."Improving resolution of superlens lithography by phase-shifting mask".OPTICS EXPRESS 19.17(2011):15982-15989.

入库方式: OAI收割

来源:光电技术研究所

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