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Sub-diffraction-limited interference photolithography with metamaterials

文献类型:期刊论文

作者Xu, Ting; Zhao, Yanhui; Ma, Junxian; Wang, Changtao; Cui, Jianhua; Du, Chunlei; Luo, Xiangang
刊名OPTICS EXPRESS
出版日期2008-09-01
卷号16期号:18页码:13579-13584
英文摘要We present that an interference lithography technique beyond the diffraction limit can be theoretically achieved by positing an anisotropic metamaterial under the conventional lithographic mask. Based on the special dispersion characteristics of the metamaterial, only the enhanced evanescent waves with high spatial frequencies can transmit through the metamaterial and contribute to the lithography process. Rigorous coupled wave analysis shows that with 442nm exposure light, one-dimensional periodical structures with 40nm features can be patterned. This technique provides an alternative method to fabricate large-area nanostructures. (c) 2008 Optical Society of America.
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]LITHOGRAPHY ; REFRACTION ; RESOLUTION
收录类别SCI
语种英语
WOS记录号WOS:000259270600011
公开日期2015-12-24
源URL[http://ir.ioe.ac.cn/handle/181551/3601]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位Chinese Acad Sci, State Key Lab Opt Technol Microfabricat, Inst Opt & Elect, Chengdu 610209, Peoples R China
推荐引用方式
GB/T 7714
Xu, Ting,Zhao, Yanhui,Ma, Junxian,et al. Sub-diffraction-limited interference photolithography with metamaterials[J]. OPTICS EXPRESS,2008,16(18):13579-13584.
APA Xu, Ting.,Zhao, Yanhui.,Ma, Junxian.,Wang, Changtao.,Cui, Jianhua.,...&Luo, Xiangang.(2008).Sub-diffraction-limited interference photolithography with metamaterials.OPTICS EXPRESS,16(18),13579-13584.
MLA Xu, Ting,et al."Sub-diffraction-limited interference photolithography with metamaterials".OPTICS EXPRESS 16.18(2008):13579-13584.

入库方式: OAI收割

来源:光电技术研究所

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