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• 长春光学精密机械与... [17]

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• OAI收割 [17]

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• 会议论文 [17]

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• 2014 [1]
• 2013 [2]
• 2012 [1]
• 2010 [3]
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浏览/检索结果: 共17条，第1-10条 帮助 限定条件 内容类型：会议论文    专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序题名升序题名降序作者升序作者降序发表日期升序发表日期降序 High efficiency abrasive waterjet dressing of diamond grinding wheel 会议论文  OAI收割 17th International Symposium on Advances in Abrasive Technology, ISAAT 2014, September 22, 2014 - September 25, 2014, Kailua, HI, United states 作者:  Wang J. 收藏  |  浏览/下载：112/0  |  提交时间：2015/04/27 A software design of data acquisition system based on optimal control AMT 会议论文  OAI收割 2013 International Conference on Advances in Materials Science and Manufacturing Technology, AMSMT 2013, May 18, 2013 - May 19, 2013, Xiamen, Fujian, China, May 18, 2013 - May 19, 2013 作者:  Sun T. 收藏  |  浏览/下载：16/0  |  提交时间：2014/05/15 Design and implementation of the AMT data acquisition system structure and function 会议论文  OAI收割 4th International Conference on Manufacturing Science and Engineering, ICMSE 2013, March 30, 2013 - March 31, 2013, Dalian, China, March 30, 2013 - March 31, 2013 作者:  Sun T. 收藏  |  浏览/下载：15/0  |  提交时间：2014/05/15 Embedded Image Grabber and Processing System Based on Camera Link 会议论文  OAI收割 2012 作者:  Zhao Y.;  Zhao Y.;  Zhao Y. 收藏  |  浏览/下载：6/0  |  提交时间：2013/03/28 In situ long trace profiler for measurement of Wolter type-I mirror (EI CONFERENCE) 会议论文  OAI收割 Advances in Metrology for X-Ray and EUV Optics III, August 1, 2010 - August 2, 2010, San Diego, CA, United states 作者:  Chen B.;  Chen B. 收藏  |  浏览/下载：19/0  |  提交时间：2013/03/25 The surface profile of Wolter type-I mirror has a great impact on the performance of Solar X-ray Telescope. According to the existing fabrication instrument and experimental conditions in our lab  an in situ Long Trace Profiler is developed and set up on the fabrication instrument in order to measure the surface profile of Wolter mirror in real time during fabrication process. Its working mechanism  structural parameters and data processing algorithm are investigated. The prototype calibrated by a standard plane mirror is used to measure a sample of Wolter type-I mirror. The results show that our prototype can achieve an accuracy of 2.6rad rms for slope error with a stability of 1.33rad during the whole measurement period. This can meet further fabrication requirements. 2010 Copyright SPIE - The International Society for Optical Engineering.   Dynamic Closed-loop Test for Real-time Drift Angle Adjustment of Space Camera on the Earth 会议论文  OAI收割 2010 作者:  Wang D. 收藏  |  浏览/下载：6/0  |  提交时间：2013/03/28 In situ Long Trace Profiler for measurement of Wolter type-I mirror 会议论文  OAI收割 2010 作者:  Chen B.;  Chen B. 收藏  |  浏览/下载：5/0  |  提交时间：2013/03/28 Fabrication and testing of hard X-ray hourglass lenses 会议论文  OAI收割 2009 Liang J. Q.; Zhu Y. Q.; Cui N. D.; Liang Z. Z.; Le Z. C.; Yi F. T.; Hou F. J.; Zhu P. P.; Dong W.; Wang W. B. 收藏  |  浏览/下载：10/0  |  提交时间：2013/03/28 The fabrication and study of ZnO-based thin film transistors (EI CONFERENCE) 会议论文  OAI收割 Asia Display 2007, AD'07, March 12, 2007 - March 16, 2007, Shanghai, China 作者:  Wang C. 收藏  |  浏览/下载：14/0  |  提交时间：2013/03/25 Bottom-gate-type thin film transistors using ZnO as an active channel layer (ZnO-TF-TS) have been constructed. The ZnO layers were deposited using metal organic chemical vapor deposition (MOCVD)[1-3] at about 360C. SiO2 was used as the material of gate insulator to suppress the leakage current effectively and to enable the ZnO-TFT to operate successfully. The drain current on-to-off ratio of ZnO-TFTs fabricated on the substrate of glass is about 104. The average optical transmission of ZnO-TFTs in the visible portion is 80%. All above shows that it is possible to fabricate a transparent TFT using ZnO as an active channel layer instead of the traditional Si material.   The study of ZnO film growth and the fabrication of ZnO-based thin film transistors 会议论文  OAI收割 2007 作者:  Wang C. 收藏  |  浏览/下载：15/0  |  提交时间：2013/03/28