机构

• 长春光学精密机械与物... [2]

采集方式

• OAI收割 [2]

内容类型

• 会议论文 [2]

发表日期

• 2010 [1]
• 2005 [1]

学科主题

筛选

浏览/检索结果: 共2条，第1-2条 帮助 限定条件 内容类型：会议论文    专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序题名升序题名降序作者升序作者降序发表日期升序发表日期降序 Ground-based measurement of the space object temperature (EI CONFERENCE) 会议论文  OAI收割 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, April 26, 2010 - April 29, 2010, Dalian, China 作者:  Wu Y.-H.;  Wang J.-L.;  Wang J.-L. 收藏  |  浏览/下载：34/0  |  提交时间：2013/03/25 Multi-band IR data of the space object can be used in the fields of object identification and space surveillance. The radiation characteristics of the object can be obtained by analyzing these data. These characteristics include temperature  area  emissivity  absorptivity  reflectivity  and temporal trends. The infrared radiation temperature of the space object is an important characteristic from which the object's working state in orbit can be judged. We apply the method of measuring the spectral distribution of the object and fit the data to the Planck formula to determine the temperature. In order to improve the precision of measuring temperature on the space object  we optimize the centric wavelength and the bandwidth effectively. Also  we use a simple program to implement temperature measurement. 2010 Copyright SPIE - The International Society for Optical Engineering.   The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文  OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Wu X.; Lei F.; Yatagai T. 收藏  |  浏览/下载：11/0  |  提交时间：2013/03/25 We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film  the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change  the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.