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Gimbal displacement error analysis on an electro-optical seeker (EI CONFERENCE) 会议论文  OAI收割
Optical Design and Testing IV, October 18, 2010 - October 20, 2010, Beijing, China
作者:  
Zhang X.;  Zhang X.;  Zhang X.
收藏  |  浏览/下载:23/0  |  提交时间:2013/03/25
It is essential to analyze the gimbal displacement errors for a seeker due to the importance for cueing of targets and tracking for the final approach. Otherwise  for a seeker electro-driven with a concentric glass dome  the large errors will decrease the picking  pointing  and tracking precision rooted from the displacement errors existing between the rotation center of the optical system and the gimbal. And the gimbaled camera system displacement errors are never eliminated but reduced due to the geometric errors consists of geometric tolerances of gimbal structure  manufacture  installation and vibration coming from working environment. In this paper  the gimbal displacement errors in an electro-optically stabilized platform resulting from geometric errors and environment errors were analyzed and shown in detail. The mathematical modal of the gimbal displacement errors created based on multi-body dynamics demonstrated the connection between the gimbal displacement errors and the stabilized platform. Taking a visible light image seeker as a case  the diameter is 120mm  and the geometric tolerances came from the values of primary design and the vibration data came from the environmental vibration test on the pitch-yaw seeker  and at the same time  the errors resulting from installation were considered too. Based on calculating  the maximum gimbal displacement error will reach to 0.2mm for pitching angle smaller than 40 and yawing angle smaller than 60. However  the critical parts have been found out according to the probability theory and the reliability analysis successfully used in the paper  and finally  the maximum gimbal displacement error reduced to 0.1mm  which is acceptable corresponding to the picking  pointing and tracking precision for an optical imaging seeker. 2010 Copyright SPIE - The International Society for Optical Engineering.