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CAS IR Grid
机构
长春光学精密机械与物... [1]
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OAI收割 [1]
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会议论文 [1]
发表日期
2011 [1]
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A small thickness measurement system based on PSD and FPGA (EI CONFERENCE)
会议论文
OAI收割
3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011, Shanghai, China
作者:
Guo J.
;
Guo J.
;
He X.
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提交时间:2013/03/25
Considering that the requirement of industrial manufacture
An AT89S51 singlechip works as the core processor of the system. By two laser triangulation
a small thickness measurement system based on PSD and FPGA is presented. It takes S3931 PSD of one dimension as position detection device
A FPGA produces logic control signals for the whole system
the small displacement is converted to differential voltages
which is made by Hamamatsu in Japan
and after amplification and A/D transformation
8-bit parallel data is send to singlechip from FPGA by external interrupts
and the final calculation results output to the LCD display module. After digital micro meter calibration
we get the small thickness. Experiments show that the detection accuracy of the system is not less than 10um.