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Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文  OAI收割
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
作者:  
Chen B.;  Chen B.
收藏  |  浏览/下载:26/0  |  提交时间:2013/03/25
A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.  
Low-energy D~(*+)_1~0 scattering and the nature of resonance-like structure Z~+(4430) 期刊论文  OAI收割
中国物理C, 2010, 期号: 4, 页码: 1372-1374
作者:  
Gong M(宫明);  Chen Y(陈莹);  Meng GZ(蒙国站);  He S(何颂);  Li G(李刚)
收藏  |  浏览/下载:22/0  |  提交时间:2015/12/10
ANALYSIS OF THE EFFECT OF CROWN STRUCTURE CHANGES ON BACKSCATTERING COEFFICIENT USING MODELING AND SAR DATA 会议论文  OAI收割
2009 Ieee International Geoscience and Remote Sensing Symposium, Vols 1-5, New York
Guo, Zhifeng; Ni, Wenjian; Sun, Guoqing
收藏  |  浏览/下载:24/0  |  提交时间:2014/12/07