中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共28条,第1-10条 帮助

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Sub-Nanogram Resolution Measurement of Inertial Mass and Density Using Magnetic-Field-Guided Bubble Microthruster 期刊论文  OAI收割
ADVANCED SCIENCE, 2024, 卷号: 11, 期号: 29, 页码: 11
作者:  
Wang LL(王雷磊);  Sheng, Minjia;  Chen, Li;  Yang FC(杨丰畅);  Li CL(李辰璐)
  |  收藏  |  浏览/下载:6/0  |  提交时间:2024/09/09
Focal beam resolution analysis of wide-band, wide-azimuth and high-density land 3D seismic acquisition geometries 期刊论文  OAI收割
CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION, 2020, 卷号: 63, 期号: 10, 页码: 3868-3885
作者:  
Chang ZiJuan;  Wei Wei;  Fu LiYun;  Qin Nan;  Su Jun
  |  收藏  |  浏览/下载:29/0  |  提交时间:2020/12/07
Understanding Current and Future Fragmentation Dynamics of Urban Forest Cover in the Nanjing Laoshan Region of Jiangsu, China 期刊论文  OAI收割
REMOTE SENSING, 2020, 卷号: 12, 期号: 1, 页码: 25
作者:  
Shen, Wenjuan;  Mao, Xupeng;  He, Jiaying;  Dong, Jinwei;  Huang, Chengquan
  |  收藏  |  浏览/下载:18/0  |  提交时间:2020/05/19
The Heterogeneity of Air Temperature in Urban Residential Neighborhoods and Its Relationship with the Surrounding Greenspace 期刊论文  OAI收割
REMOTE SENSING, 2018, 卷号: 10, 期号: 6, 页码: -
作者:  
Qian, Yuguo;  Zhou, Weiqi;  Hu, Xiaofang;  Fu, Fan
  |  收藏  |  浏览/下载:25/0  |  提交时间:2019/06/17
Density profile evolution on EAST tokamak by the polarimeter/interferometer system 期刊论文  OAI收割
FUSION ENGINEERING AND DESIGN, 2018, 卷号: 131, 页码: 29-32
作者:  
Zhu, X.;  Zeng, L.;  Liu, H. Q.;  Jie, Y. X.;  Yang, Y.
  |  收藏  |  浏览/下载:20/0  |  提交时间:2019/11/12
Areal density and spatial resolution of high energy electron radiography 期刊论文  OAI收割
CHINESE PHYSICS B, 2018, 卷号: 27, 页码: 035202
作者:  
Xiao, Jiahao;  Zhang, Zimin;  Cao, Shuchun;  Yuan, Ping;  Shen, Xiaokang
  |  收藏  |  浏览/下载:48/0  |  提交时间:2018/05/31
Nondestructive material characterization of meteorites with synchrotron-based high energy x-ray phase micro-computed tomography 期刊论文  OAI收割
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2017, 卷号: 50, 期号: 5, 页码: -
作者:  
Liu, HQ;  Xiao, TQ;  Xie, HL;  Fu, YN;  Zhang, XL
  |  收藏  |  浏览/下载:24/0  |  提交时间:2017/12/08
High energy electron radiography scheme with high spatial and temporal resolution in three dimension based on a e-LINAC 期刊论文  OAI收割
LASER AND PARTICLE BEAMS, 2016, 卷号: 34, 页码: 338-342
作者:  
Zhou, X.;  Ren, J.;  Huang, W.;  Tang, C.;  Xu, H.
  |  收藏  |  浏览/下载:24/0  |  提交时间:2018/05/31
Evolution of the structure and electronic properties of neutral and anion FeSn mu (n=1-7, mu=0,-1) clusters: A comprehensive analysis 期刊论文  OAI收割
Journal of Alloys and Compounds, 2013, 卷号: 573, 页码: 133-141
L. P. Ding; X. Y. Kuang; P. Shao; M. M. Zhong
收藏  |  浏览/下载:19/0  |  提交时间:2013/12/24
Nanoscale patterns made by using a 13.5-nm Schwarzschild objective and a laser produced plasma source (EI CONFERENCE) 会议论文  OAI收割
Optical Micro- and Nanometrology IV, April 16, 2012 - April 18, 2012, Brussels, Belgium
作者:  
Wang X.;  Wang X.;  Wang X.;  Wang Z.;  Wang Z.
收藏  |  浏览/下载:37/0  |  提交时间:2013/03/25
Lithium fluoride (LiF) crystal is a very promising candidate as nanometer resolution EUV and soft X-ray detector. Compared with other EUV and soft X-ray detectors  charge coupled device and photographic films  LiF crystal has high resolution  large field of view and wide dynamic range. In this paper  using LiF crystal as EUV detector and a Schwarzschild objective (SO) working at 13.5nm as projection optics  mesh images with 4.2 m  1.2 m and 800 nm line width and pinhole patterns with 1.5m diameter are acquired in projection imaging mode and direct writing mode  respectively. Fluorescence intensity profiles of images show that the resolution of mesh image is 900 nm  and the one of pinhole image is 800 nm. In the experiments  a spherical condense mirror based on normal incidence type is used to eliminate the damage and contamination on the masks (mesh and pinhole) caused by the laser plasma  and the energy density is not decreased compared with that the masks are close to the plasma. The development of the SO  the alignment of the objective and the imaging experiments are also reported. 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).