中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
高能物理研究所 [2]
长春光学精密机械与物... [1]
上海应用物理研究所 [1]
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OAI收割 [3]
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期刊论文 [3]
会议论文 [1]
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2015 [3]
2010 [1]
学科主题
Physics [1]
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Monochromatic x-ray-induced thermal effect on four-reflection "nested" mev-monochromators: dynamical diffraction theory and finite-element analysis
期刊论文
iSwitch采集
Chinese physics c, 2015, 卷号: 39, 期号: 9, 页码: 7
作者:
Hu Ling-Fei
;
Gao Li-Dan
;
Li Zhen-Jie
;
Wang Shan-Feng
;
Sheng Wei-Fan
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  |  
浏览/下载:31/0
  |  
提交时间:2019/04/23
Dynamical diffraction theory
High energy resolution monochromator
Heat load
Monochromatic X-ray-induced thermal effect on four-reflection "nested" meV-monochromators: dynamical diffraction theory and finite-element analysis
期刊论文
OAI收割
CHINESE PHYSICS C, 2015, 卷号: 39, 期号: 9, 页码: 96004
作者:
Hu LF(胡凌飞)
;
Gao LD(高立丹)
;
Li ZJ(李贞杰)
;
Wang SF(王山峰)
;
Sheng WF(盛伟繁)
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  |  
浏览/下载:43/0
  |  
提交时间:2016/04/18
dynamical diffraction theory
high energy resolution monochromator
heat load
A new extra-focus monochromator designed for high-performance VUV beamlines
期刊论文
OAI收割
JOURNAL OF SYNCHROTRON RADIATION, 2015, 卷号: 22, 页码: 328—335
作者:
Xue, CF
;
Wu, YQ
;
Zou, Y
;
Xue, L
;
Wang, Y
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浏览/下载:18/0
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提交时间:2015/12/09
SPHERICAL GRATING MONOCHROMATOR
X-RAY BEAMLINE
HIGH-RESOLUTION
RESOLVED PHOTOEMISSION
LIGHT-SOURCE
LOW-ENERGY
HIGH-FLUX
SUPERCONDUCTORS
ALS
High-performance soft x-ray spectromicroscopy beamline at SSRF (EI CONFERENCE)
会议论文
OAI收割
作者:
Xue C.
;
Chen J.
;
Wang Y.
;
Wang Y.
;
Wang Y.
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浏览/下载:38/0
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提交时间:2013/03/25
The Shanghai Synchrotron Radiation Facility (SSRF) is the first third-generation synchrotron facility in China and operated at an electron energy of 3.5 GeV. One of the seven beamlines in the first construction phase is devoted to soft x-ray spectromicroscopy and is equipped with an elliptically polarized undulator light source
a plane grating monochromator
and a scanning transmission x-ray microscope end station. Initial results reveal the high performance of this beamline
with an energy resolving power estimated to be over 10 000 at the argon L-edge and a spatial resolution better than 30 nm. 2010 American Institute of Physics.