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	The underlying reason of DIO additive on the improvement polymer solar cells performance 期刊论文 OAI收割 applied surface science, 2014, 卷号: 305, 页码: 221-226 作者: Wang, Zixuan; Zhang, Fujun; Li, Lingliang; An, Qiaoshi; Wang, Jian 收藏 \| 浏览/下载：29/0 \| 提交时间：2015/11/17 Polymer solar cells DIO additive Interference of light Transfer matrix method
	Advanced astigmatism-corrected tandem Wadsworth mounting for small-scale spectral broadband imaging spectrometer (EI CONFERENCE) 会议论文 OAI收割作者: Lin G.-Y. 收藏 \| 浏览/下载：48/0 \| 提交时间：2013/03/25 Tandem gratings of double-dispersion mount make it possible to design an imaging spectrometer for the weak light observation with high spatial resolution high spectral resolution and high optical transmission efficiency. The traditional tandem Wadsworth mounting is originally designed to match the coaxial telescope and large-scale imaging spectrometer. When it is used to connect the off-axis telescope such as off-axis parabolic mirror it presents lower imaging quality than to connect the coaxial telescope. It may also introduce interference among the detector and the optical elements as it is applied to the short focal length and small-scale spectrometer in a close volume by satellite. An advanced tandem Wadsworth mounting has been investigated to deal with the situation. The Wadsworth astigmatism-corrected mounting condition for which is expressed as the distance between the second concave grating and the imaging plane is calculated. Then the optimum arrangement for the first plane grating and the second concave grating which make the anterior Wadsworth condition fulfilling each wavelength is analyzed by the geometric and first order differential calculation. These two arrangements comprise the advanced Wadsworth mounting condition. The spectral resolution has also been calculated by these conditions. An example designed by the optimum theory proves that the advanced tandem Wadsworth mounting performs excellently in spectral broadband. 2012 Optical Society of America.
	Scaling and analyzing the influence of fluid surface of fluid with nano-granular through speckle pattern experiment (EI CONFERENCE) 会议论文 OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者: Wang X.; Wang Y.; Wang Y.; Wang Y.; Wang Y. 收藏 \| 浏览/下载：28/0 \| 提交时间：2013/03/25 An optical system with double beam interference system was designed to measure the movement of nano-particles in fluid with laser speckle technology. In order to investigate the influence of the scattering light generated from liquid surface on speckle patterns the liquid surface contour was dynamically detected by WYKO during nano-particle movement. The result demonstrates that the fluctuation of fluid surface is slight. Meanwhile in order to further analyze this effect a piece of ground glass was employed. The process of ground glass to be polished to optical glass was studied and tested continuously using WYKO and laser speckle technology. And then the speckle patterns generated from kerosene fluid surface were studied. By contrast the results show that the fluid surface is transparent to the measurement wavelength. The influence of the surface of fluid can be neglected. Furthermore the conclusion illustrates that laser speckle technique is an effective and reliable method to study the movement of nano-granular in fluid.
	Real-time SPR phase detection for protein micro-array 期刊论文 OAI收割 ACTA PHYSICO-CHIMICA SINICA, 2005, 卷号: 21, 期号: 8, 页码: 888-892 作者: Yu, XL; Wei, X; Wang, DX; Ding, X; Liao, W \| 收藏 \| 浏览/下载：20/0 \| 提交时间：2019/04/09 Protein Micro-array Spr Phase Detection Interference Of Polarized Light
	The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Wu X.; Lei F.; Yatagai T. 收藏 \| 浏览/下载：26/0 \| 提交时间：2013/03/25 We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.