中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Liu L.;  Yang H.;  Liu L.
收藏  |  浏览/下载:21/0  |  提交时间:2013/03/25
We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.  
Search for anomalous weak dipole moments of the tau lepton 期刊论文  OAI收割
EUROPEAN PHYSICAL JOURNAL C, 2003, 卷号: 30, 期号: 3, 页码: 291-304
作者:  
ALEPH Collaboration
收藏  |  浏览/下载:22/0  |  提交时间:2015/12/02
Measurement of the Michel parameters and the nu(tau) helicity in tau lepton decays 期刊论文  OAI收割
EUROPEAN PHYSICAL JOURNAL C, 2001, 卷号: 22, 期号: 2, 页码: 217-230
作者:  
ALEPH Collaborat
收藏  |  浏览/下载:16/0  |  提交时间:2015/12/02