机构

• 长春光学精密机械与物... [1]
• 合肥物质科学研究院 [1]
• 西安光学精密机械研究... [1]

采集方式

• OAI收割 [3]

内容类型

• 期刊论文 [2]
• 会议论文 [1]

发表日期

• 2024 [1]
• 2020 [1]
• 2008 [1]

学科主题

筛选

浏览/检索结果: 共3条，第1-3条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 Enhanced optical nonlinearity of epsilon-near-zero metasurface by quasi-bound state in the continuum 期刊论文  OAI收割 Materials Today Nano, 2024, 卷号: 26 作者:  Shi, Wenjuan;  Wang, Zhaolu;  Zhang, Changchang;  Zhang, Congfu;  Li, Wei   |  收藏  |  浏览/下载：43/0  |  提交时间：2024/07/02 Bound states in the continuum  Epsilon-near-zero materials  Dielectric-metal hybrid structure  Friedrich-Wintergen BIC  Nonlinear refractive index coefficient   Turbulent Structure Function Analysis Using Wireless Micro-Thermometer 期刊论文  OAI收割 IEEE ACCESS, 2020, 卷号: 8 作者:  Shao, Shiyong;  Qin, Fuqiang;  Liu, Qing;  Xu, Manman;  Cheng, Xueling   |  收藏  |  浏览/下载：72/0  |  提交时间：2020/10/26 Temperature measurement  Refractive index  Atmospheric measurements  Ocean temperature  Temperature sensors  Wires  Platinum  Refractive index structure coefficient  temperature fluctuation  sensitivity calibration  wireless control  Monin-Obukhov length  scaling exponent   Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Liu L.;  Yang H.;  Liu L. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.