中国科学院机构知识库网格
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Facile fabrication of a superamphiphobic surface on the copper substrate 期刊论文  OAI收割
Journal of Colloid and Interface Science, 2012, 卷号: 367, 页码: 443-449
作者:  
Zhu XT(朱小涛);  Zhang ZZ(张招柱);  Xu XH(徐向辉);  Men XH(门学虎);  Yang J(杨进)
收藏  |  浏览/下载:19/0  |  提交时间:2013/07/12
Bioinspired Green Synthesis of Nanomaterials and their Applications 期刊论文  OAI收割
current nanoscience, 2010, 卷号: 6, 期号: 5, 页码: 452-468
Gao SY; Li ZD; Zhang HJ
收藏  |  浏览/下载:24/0  |  提交时间:2012/04/25
Novel method for optimizing polishing tool-path in CCOS based on weighted-iterative algorithm (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Zhang X.-J.;  Wang X.;  Wang X.;  Wang X.;  Wang X.-K.
收藏  |  浏览/下载:41/0  |  提交时间:2013/03/25
In Computer Controlled Optical Surfacing (CCOS)  polishing tool-path is the base of solving other control parameters such as dwell time. In order to improve the fabrication results of polishing off-axis aspheric  a novel method to optimize the tool-path is discussed in this paper. The optimizing method named weighted-iterative algorithm is according to the balance principle of the particle system. The power factor of each dwell point represents the requirement of dwell density. Considering the factors which influence the polishing result  the power factors cosist of three elements include constant  error distribution and dwell distance of workpiece edge. The tool-path is solved by numerical iterative method. In the end  an error data is simulated with actual parameters using the matrix-based algorithm with two different tool-paths. The one is X-Y uniform spacing model and the other one is to optimize it based on the first. The comparison shows that the results of the optimized one are much better than traditional one  especially the rms convergence rate. Theory of the algorithm is simple and exercisable  and it satisfies practical requirement as well. 2009 SPIE.  
Electrochemical Sensing and Biosensing Platform Based on Chemically Reduced Graphene Oxide 期刊论文  OAI收割
analytical chemistry, 2009, 卷号: 81, 期号: 14, 页码: 5603-5613
Zhou M; Zhai YM; Dong SJ
收藏  |  浏览/下载:236/28  |  提交时间:2010/05/27
Fabrication of polysilicon thin film on glass with low-temperature UV-assisted crystallization (EI CONFERENCE) 会议论文  OAI收割
ICO20: Display Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China
Huang J. Y.; Ling Z. H.; Jing H.; Fu G. Z.; Zhao Y. H.
收藏  |  浏览/下载:32/0  |  提交时间:2013/03/25
The amorphous silicon (a-Si) film was crystallized on glass by a simple method employed ultraviolet at temperatures as low as 400C. The employ of ultraviolet enhanced the crystallization of amorphous silicon. This method is able to uniformly crystallized large-area amorphous silicon films. The polysilicon films crystallized by this way are suitable for the fabrication of thin film transistors on ordinary glass. Crystallization process is performed in a furnace. Amorphous silicon sample is placed on a hot plate and irradiated by a bank of ultraviolet lamps through a diffuser plate to improve the uniformity of light that irradiates the sample. Raman microscopy is used for analyzing the qualities of UV-assisted crystallized silicon films. By measuring the Raman spectra the effects of anneal temperature and process time on the crystallizing behavior  crystallinity and grain size of the processed films were obtained. There has a threshold temperature for crystallization of amorphous silicon film in the presence of ultraviolet irradiation with certain intensity  i.e. by ultraviolet irradiation with certain intensity only when the temperature is up to the threshold temperature  the crystallization can be triggered. The threshold temperature is 400C when the intensity of ultraviolet irradiation is 1mW/cm2. Above threshold temperature  the increase of anneal temperature increased the rate of crystallization. Crystallinity and grain size extracted from Raman spectra of samples increase with the extending of process time at certain temperature. Crystallization of amorphous silicon film with thickness of 50nm completed within 6 hours at 400C irradiated by ultraviolet with intensity of 2mW/cm2.