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浏览/检索结果: 共344条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Foliar LM and SEM Insights: Investigating Epidermal Features and Its Taxonomic Implications in Some Verbenaceae Taxa 期刊论文  OAI收割 POLISH JOURNAL OF ENVIRONMENTAL STUDIES, 2025, 卷号: 34, 期号: 3, 页码: 2673-2685 作者:  Hadi, Fazal;  Dost, Sania;  Khan, Muhammad Nauman;  Ullah, Barkat;  Razzaq, Abdul   |  收藏  |  浏览/下载：7/0  |  提交时间：2025/04/21 foliar assessment  morpho-anatomy  Pakistan  scanning electron microscopy  Verbenaceae   TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images 期刊论文  OAI收割 INTEGRATION-THE VLSI JOURNAL, 2024, 卷号: 95, 页码: 9 作者:  Xiao, Wei;  Zhao, Fazhan;  Zhao, Kun;  Ma, Hongtu;  Li, Qing   |  收藏  |  浏览/下载：28/0  |  提交时间：2024/02/20 Scanning electron microscopy  Deep learning  Hardware trust and assurance  Integrated circuit   Assessment of soil aggregate pore structure after 8 years of cultivation from the parent material of a Mollisol 期刊论文  OAI收割 CATENA, 2024, 卷号: 235, 页码: 10 作者:  Ren, Lidong;  Yao, Shuihong;  Sun, Jingwei;  Zhou, Hu   |  收藏  |  浏览/下载：22/0  |  提交时间：2024/01/22 Aggregate pore structure  Mollisol  Agriculture restoration practices  SR-mu CT  Scanning electron microscopy   Formation mechanism of composite secondary phase particles in a solution-treated Si-modified Zircaloy-4 期刊论文  OAI收割 SCRIPTA MATERIALIA, 2024, 卷号: 239, 页码: 6 作者:  Ali, Muhammad;  Yuan, Fusen;  Han, Fuzhou;  Guo, Wenbin;  Ren, Jie   |  收藏  |  浏览/下载：16/0  |  提交时间：2024/01/07 Si-modified zircaloy-4  Composite secondary phase particles  Scanning/transmission electron microscopy  (STEM)  Crystallography   Novel methods for locating and matching IC cells based on standard cell libraries 期刊论文  OAI收割 MICROELECTRONIC ENGINEERING, 2024, 卷号: 283, 页码: 12 作者:  Liu, Can;  Wang, Kaige   |  收藏  |  浏览/下载：26/0  |  提交时间：2024/02/22 Reverse engineering  Integrated circuits  Scanning electron microscopy  Image processing  Hardware security   Atomic-scale investigation of interface structures in polysynthetically twinned TiAl single crystals 期刊论文  OAI收割 INTERMETALLICS, 2024, 卷号: 164, 页码: 8 作者:  He, Neng;  Cheng, Yongxin;  Yuan, Tian;  He, Lianlong;  Chen, Chunlin   |  收藏  |  浏览/下载：3/0  |  提交时间：2024/01/07 Polysynthetically twinned TiAl crystals  Interface structures  Steps  Transformation  High-resolution scanning transmission electron microscopy   Pollen morphology of selected tropical plants in Peninsular Malaysia and its implication in the paleoecological reconstruction of Southeast Asia 期刊论文  OAI收割 REVIEW OF PALAEOBOTANY AND PALYNOLOGY, 2023, 卷号: 316, 页码: 53 作者:  Dai, Lu;  Zhang, Qingyun;  Foong, Swee Yeok;  Cheng, Zhongjing;  Weng, Chengyu   |  收藏  |  浏览/下载：20/0  |  提交时间：2023/10/09 Pollen morphology  Tropical forest  Scanning electron microscopy  Malaysia  Southeast Asia   Fracture behaviour of Zr(Fe,Cr)(2) Laves phase precipitates in Zircaloy-4 subjected to beta forging 期刊论文  OAI收割 JOURNAL OF ALLOYS AND COMPOUNDS, 2023, 卷号: 952, 页码: 6 作者:  Ali, Muhammad;  Han, Fuzhou;  Guo, Wenbin;  Ren, Jie;  Zhang, Yingdong   |  收藏  |  浏览/下载：7/0  |  提交时间：2024/01/07 Zircaloy-4  Scanning  transmission electron microscopy (STEM)  Laves phase  Fracture   Carbonate cementing minerals in rhizoliths from Badain Jaran Desert: Implication for pedo-diagenesis and environment of dune soil 期刊论文  OAI收割 RHIZOSPHERE, 2023, 卷号: 25, 页码: 14 作者:  Sun, Qingfeng;  Zamanian, Kazem;  Huguet, Arnaud;  Wiesenberg, Guido L. B.;  Zhao, Tianlei   |  收藏  |  浏览/下载：18/0  |  提交时间：2023/10/09 Scanning electron microscopy  Energy dispersive X-ray spectroscopy  X-ray diffraction  Crystal morphology  Soil diagenesis environment   Atomic Insight into the Successive Antiferroelectric-Ferroelectric Phase Transition in Antiferroelectric Oxides 期刊论文  OAI收割 NANO LETTERS, 2023, 页码: 8 作者:  Jiang, Ru-Jian;  Cao, Yi;  Geng, Wan-Rong;  Zhu, Mei-Xiong;  Tang, Yun-Long   |  收藏  |  浏览/下载：25/0  |  提交时间：2023/05/09 antiferroelectric  lead zirconate  consecutive phase transformation  short-period phase  scanning transmission electron microscopy