中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
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金属研究所 [106]
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期刊论文 [310]
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Foliar LM and SEM Insights: Investigating Epidermal Features and Its Taxonomic Implications in Some Verbenaceae Taxa
期刊论文
OAI收割
POLISH JOURNAL OF ENVIRONMENTAL STUDIES, 2025, 卷号: 34, 期号: 3, 页码: 2673-2685
作者:
Hadi, Fazal
;
Dost, Sania
;
Khan, Muhammad Nauman
;
Ullah, Barkat
;
Razzaq, Abdul
  |  
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2025/04/21
foliar assessment
morpho-anatomy
Pakistan
scanning electron microscopy
Verbenaceae
Moire fringe imaging of heterostructures by scanning transmission electron microscopy
期刊论文
OAI收割
MICRON, 2024, 卷号: 185, 页码: 13
作者:
Hu, Wen-Tao
;
Tian, Min
;
Wang, Yu-Jia
;
Zhu, Yin-Lian
  |  
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2025/04/27
Scanning transmission electron microscopy
Moire
fringes
Coherent scattering
Incoherent imaging
Heterostructure
Using Small Punch Test to Investigate the Mechanical Properties of X42 Exposed to Gaseous Hydrogen: Effect of Pressure, Pre-charge Time, Punch Velocity and Oxygen Content
期刊论文
OAI收割
ACTA METALLURGICA SINICA-ENGLISH LETTERS, 2024, 页码: 23
作者:
Wang, Hu-Yue
;
Ming, Hong-Liang
;
Hou, Dong-Ceng
;
Wang, Jian-Qiu
;
Ke, Wei
  |  
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2025/04/27
X42 pipeline steel
Hydrogen embrittlement
Mechanical properties
Scanning electron microscopy (SEM)
Small punch test
Using Small Punch Test to Investigate the Mechanical Properties of X42 Exposed to Gaseous Hydrogen: Effect of Pressure, Pre-charge Time, Punch Velocity and Oxygen Content
期刊论文
OAI收割
ACTA METALLURGICA SINICA-ENGLISH LETTERS, 2024, 页码: 23
作者:
Wang, Hu-Yue
;
Ming, Hong-Liang
;
Hou, Dong-Ceng
;
Wang, Jian-Qiu
;
Ke, Wei
  |  
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2025/04/27
X42 pipeline steel
Hydrogen embrittlement
Mechanical properties
Scanning electron microscopy (SEM)
Small punch test
Efficient rGO-supported CeO
2
-Y
2
O
3
-Nd
2
O
3
nanocomposite electrocatalyst for water splitting (HER/OER) in alkaline medium
期刊论文
OAI收割
JOURNAL OF THE KOREAN CERAMIC SOCIETY, 2024, 页码: 20
作者:
Munawar, Tauseef
;
Bashir, Ambreen
;
Batoo, Khalid Mujasam
;
Mukhtar, Faisal
;
Nadeem, Muhammad Shahid
  |  
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2025/11/17
Bifunctional electrocatalysts
Scanning transmission electron microscopy
Alkaline medium
Nickel foam
Oxygen evolution reaction
Hydrogen evolution reaction
TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images
期刊论文
OAI收割
INTEGRATION-THE VLSI JOURNAL, 2024, 卷号: 95, 页码: 9
作者:
Xiao, Wei
;
Zhao, Fazhan
;
Zhao, Kun
;
Ma, Hongtu
;
Li, Qing
  |  
收藏
  |  
浏览/下载:53/0
  |  
提交时间:2024/02/20
Scanning electron microscopy
Deep learning
Hardware trust and assurance
Integrated circuit
Precipitation of multi-type nano-quasicrystals in a Mg-Zn-Y alloy
期刊论文
OAI收割
JOURNAL OF MAGNESIUM AND ALLOYS, 2024, 卷号: 12, 期号: 3, 页码: 12
作者:
Wang, W. Z.
;
Zhou, X. Z.
;
Zhang, L. F.
;
Ye, H. Q.
;
Yang, Z. Q.
  |  
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2025/04/27
Quasicrystal
Mg alloys
Rapid solidification
Scanning-transmission electron microscopy
Assessment of soil aggregate pore structure after 8 years of cultivation from the parent material of a Mollisol
期刊论文
OAI收割
CATENA, 2024, 卷号: 235, 页码: 10
作者:
Ren, Lidong
;
Yao, Shuihong
;
Sun, Jingwei
;
Zhou, Hu
  |  
收藏
  |  
浏览/下载:52/0
  |  
提交时间:2024/01/22
Aggregate pore structure
Mollisol
Agriculture restoration practices
SR-mu CT
Scanning electron microscopy
Formation mechanism of composite secondary phase particles in a solution-treated Si-modified Zircaloy-4
期刊论文
OAI收割
SCRIPTA MATERIALIA, 2024, 卷号: 239, 页码: 6
作者:
Ali, Muhammad
;
Yuan, Fusen
;
Han, Fuzhou
;
Guo, Wenbin
;
Ren, Jie
  |  
收藏
  |  
浏览/下载:54/0
  |  
提交时间:2024/01/07
Si-modified zircaloy-4
Composite secondary phase particles
Scanning/transmission electron microscopy
(STEM)
Crystallography
Novel methods for locating and matching IC cells based on standard cell libraries
期刊论文
OAI收割
MICROELECTRONIC ENGINEERING, 2024, 卷号: 283, 页码: 12
作者:
Liu, Can
;
Wang, Kaige
;
Li, Qing
;
Zhao, Fazhan
;
Zhao, Kun
  |  
收藏
  |  
浏览/下载:66/0
  |  
提交时间:2024/02/22
Reverse engineering
Integrated circuits
Scanning electron microscopy
Image processing
Hardware security