中国科学院机构知识库网格系统: 检索

浏览/检索结果: 共4条，第1-4条

帮助

条数/页：排序方式：
	Preparation and characterization of paraffin/palygorskite shape-stable composite phase change materials for thermal energy storage 期刊论文 OAI收割 JOURNAL OF ENERGY STORAGE, 2021, 卷号: 34, 页码: 7 作者: Zhang, Ning; Guo, Haijun; Xiong, Lian; Zhang, Hairong; Chen, Xinde \| 收藏 \| 浏览/下载：31/0 \| 提交时间：2021/10/27 Thermal energy storage Palygorskite Paraffin Shape-stable Composite phase change materials
	Solvothermal synthesis of metal nanocrystals and their applications 期刊论文 OAI收割 nano today, 2015, 卷号: 10, 期号: 2, 页码: 240-267 作者: Lai,Jianping; Niu,Wenxin; Luque,Rafael; Xu,Guobao 收藏 \| 浏览/下载：38/0 \| 提交时间：2016/04/29 ENHANCED ELECTROCATALYTIC ACTIVITY ONE-POT SYNTHESIS HIGH-INDEX FACETS SHAPE-CONTROLLED SYNTHESIS FORMIC-ACID OXIDATION HIGH-YIELD SYNTHESIS PT-NI ALLOY OXYGEN REDUCTION ELECTROCATALYSTS HIGHLY STABLE ELECTROCATALYSTS CORE-SHELL NANOCRYSTALS
	Effect of thickness on the structural, electrical and optical properties of ZnO films deposited by MBE (EI CONFERENCE) 会议论文 OAI收割 2011 International Conference on Advanced Design and Manufacturing Engineering, ADME 2011, September 16, 2011 - September 18, 2011, Guangzhou, China Yang X.; Su S.; Yi X.; Mei T. 收藏 \| 浏览/下载：25/0 \| 提交时间：2013/03/25 A set of ZnO films of different thickness have been deposited on sapphire substrates using molecular beam epitaxy (MBE) by varying the growth time and the effect of film thickness on the structural electrical and optical properties have been investigated. The X-ray diffraction (XRD) results indicate that the full width at half maximum (FWHM) of the (002) diffraction peak is decreased as the film thickness increasing and the stress along c-axis is stable. Scanning electron microscope (SEM) measurement shows that the grains become more uniform as the film grows thicker and the film surface present distinct hexagon shape as the film is grown up to a thickness of 500nm. The optical absorbance Hall mobility and photoluminescence (PL) intensity are increased in accordance with the thickness of the film. (2011) Trans Tech Publications Switzerland.
	Key techniques of laser direct writing of fine lines on the spherical surface (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Design and Fabrication, August 21, 2005 - August 26, 2005, Changchun, China Liang F.; Hu J. 收藏 \| 浏览/下载：21/0 \| 提交时间：2013/03/25 The main principles of laser direct writing (LDW) system for lines on the spherical surface (SS) are discussed. It is pointed out that line profile is determined by the exposure dose distribution which lies on the light intensity distribution of focus plane and the scanning speed. To improve the quality of line profile on the SS several key techniques as follows are introduced. Firstly the unique system configuration four axes mutually intersecting at the center of the SS is adopted which ensures the shape of the focus be maintained circular during the writing period. Secondly an automatic focus system (AFS) with the function of automatic focus in a certain range is introduced. Thirdly to guarantee the linear velocity to accord with the exposure character of the photoresist all the time an efficient arithmetic that controls motors run at appropriate angular velocity in different latitude is developed. Finally to achieve a stable and well-behaved system so as to compensate the velocity instability resulting from unavoidable errors of mechanical and electronics factor a powerful programmable multi-axis controller (PMAC) is utilized as the kernel element of the servocontrol system and the curves of step response and parabolic response achieved by feedforward and PID loop tuning indicate that the location precision and velocity stability have reached a high level. The experimental results of LDW of lines on the SS work piece with a diameter 30 mm and a radius equal to 100 mm are given. The section analysis of the lines on the photoresist by the atomic force microscope (AFM) after exposure and development is performed. The results show that line width is about 3.0 m and the steep sides of the lines are parallel to each other.