中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共6条,第1-6条 帮助

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FY-3D MERSI On-Orbit Radiometric Calibration from the Lunar View 期刊论文  OAI收割
SENSORS, 2020, 卷号: 20
作者:  
Wu, Ronghua;  Zhang, Peng;  Xu, Na;  Hu, Xiuqing;  Chen, Lin
  |  收藏  |  浏览/下载:110/0  |  提交时间:2020/11/30
A method for monitoring solar diffuser's bidirectional reflectance distribution function degradation in geostationary orbit 期刊论文  OAI收割
EUROPEAN JOURNAL OF REMOTE SENSING, 2020, 卷号: 53
作者:  
Wang Wei;  Zhang Li-Ming;  Xu Weiwei;  Si Xiao-Long;  Huang Wen-Xin
  |  收藏  |  浏览/下载:25/0  |  提交时间:2020/11/26
Highly Solar-Reflective Litchis-Like Core-Shell HGM/TiO2 Microspheres Synthesized by Controllable Heterogeneous Precipitation Method 期刊论文  OAI收割
NANO, 2017, 卷号: 12, 期号: 7
作者:  
Jin, Hu;  Xu, Dehua;  Li, Jingling;  Wang, Kelai;  Bi, Zhuoneng
  |  收藏  |  浏览/下载:34/0  |  提交时间:2017/12/31
Study on sodium water glass-based anti-reflective film and its application in dye-sensitized solar cells 期刊论文  OAI收割
thin solid films, 2016, 卷号: 610, 页码: 19-25
作者:  
Huang, Q. Z.;  Shi, J. F.;  Wang, L. L.;  Li, Y. J.;  Zhong, L. W.
收藏  |  浏览/下载:20/0  |  提交时间:2016/12/05
Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE) 会议论文  OAI收割
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China
作者:  
Li X.-Z.;  Wang X.-J.
收藏  |  浏览/下载:38/0  |  提交时间:2013/03/25
A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper  we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case  we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values  the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore  we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.  
Application of a physical model to topographic and atmosphic correction in Jiangxi rugged area, China 会议论文  OAI收割
Igarss: 2007 Ieee International Geoscience and Remote Sensing Symposium, Vols 1-12: Sensing and Understanding Our Planet, New York
Wen, Jianguang; Liu, Qinhuo; Xiao, Qing; Li, Xiaowen; Yang, Guijun; Chen, Jie
收藏  |  浏览/下载:15/0  |  提交时间:2014/12/07