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Theoretical research on parameter calculation and error analysis of Hindle auxiliary sphere method for testing convex hyperboloid mirror 会议论文  OAI收割
Beijing, China, 2021-7(23-25)
作者:  
Jiao XJ(焦晓洁);  Jiang ZB(姜自波)
  |  收藏  |  浏览/下载:45/0  |  提交时间:2022/03/31
Experimental study on hybrid compensation testing of an off-axis convex ellipsoid surface 期刊论文  OAI收割
Optics Express, 2019, 卷号: 27, 期号: 20, 页码: 27546-27561
作者:  
L.S.Yan;  D.Y.Zhu;  X.F.Zeng;  M.Li;  X.K.Wang
  |  收藏  |  浏览/下载:27/0  |  提交时间:2020/08/24
Ritchey-Common sparse-aperture testing of the Giant Steerable Science Mirror 期刊论文  OAI收割
Applied Optics, 2018, 卷号: 57, 期号: 27, 页码: 7764-7769
作者:  
An, Q. C.;  Zhang, J. X.;  Yang, F.;  Zhao, H. C.;  Cao, H. F.
  |  收藏  |  浏览/下载:13/0  |  提交时间:2019/09/17
Experimental study on subaperture stitching testing of convex hyperboloid surface 期刊论文  OAI收割
Optics Communications, 2018, 卷号: 428, 页码: 104-109
作者:  
Zhu, D. Y.;  Yan, L. S.;  Wang, X. K.;  Li, M.
  |  收藏  |  浏览/下载:12/0  |  提交时间:2019/09/17
Test of an off-axis asphere by subaperture stitching interferometry (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Zheng L.-G.;  Zhang X.-J.;  Zhang Z.-Y.;  Zhang Z.-Y.;  Deng W.-J.
收藏  |  浏览/下载:52/0  |  提交时间:2013/03/25
A new method combined subaperture stitching with interferometry(SSI) is introduced. It can test large and off-axis aspheric surfaces without the aid of other null optics. In this paper the basic principle and theory of the technique are analyzed. The synthetical optimization stitching model and effective stitching algorithm are established based on homogeneous coordinates transformation and simultaneous least-squares method. The software of SSI is devised and the prototype for testing of large aspheres by SSI is designed and developed. An off-axis asphere with the aperture of 376mm188mm is tested by this method. For comparison and validation  and the difference of PV and RMS error between them is 0.047 e and 0.006 e  the asphere is also tested by null compensation.The synthesized surface profile is consistent to that ofthe entire surface from null test  respectively. So it provides another quantitative measurement for testing large aspheric surfaces and off-axis aspheres besides null-compensation. 2009 SPIE.  
Annular sub-aperture stitching interferometry for testing of large asphreical surfaces (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Zheng L.-G.;  Zhang X.-J.;  Deng W.-J.;  Wang X.-K.
收藏  |  浏览/下载:76/0  |  提交时间:2013/03/25
Annular subaperture stitching interferometric technology can test large-aperture  and the PV and RMS of residual error of the full aperture phase distribution is 0.027 and 0.0023  high numerical aperture aspheric surfaces with high resolution  the relative error of PV and RMS is -0.53% and -0.31%  respectively. The results conclude that this splicing model and algorithm are accurate and feasible. So it provides another quantitive measurement for test aspheric surfaces especially for large aperture aspheres besides null-compensation.  low cost and high efficiency without auxiliary null optics. In this paper  the basic principle and theory of the stitching method are introduced  the reasonable mathematical model and effective splicing algorithm are established based on simultaneous least-squares method and Zernike polynomial fitting. The translation errors are eliminated from each subaperture through the synthetical optimization stitching mode  it keeps the error from transmitting and accumulating. The numerical simulations have been carried on by this method. As results  the surface map of the full aperture after stitching is consistent to the input surface map  the difference of PV error and RMS error between them is -0.0074 and -0.00052 ( is 632.8nm)  respectively  
Systematic considerations for the patterning of photonic crystal devices by electron beam lithography 期刊论文  iSwitch采集
Optics communications, 2007, 卷号: 271, 期号: 1, 页码: 241-247
作者:  
Yu, Hejun;  Yu, Jinzhong;  Sun, Fei;  Li, Zhiyong;  Chen, Shaowu
收藏  |  浏览/下载:20/0  |  提交时间:2019/05/12