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CAS IR Grid
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长春光学精密机械与物... [2]
新疆天文台 [1]
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OAI收割 [3]
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期刊论文 [2]
会议论文 [1]
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2024 [1]
2019 [1]
2011 [1]
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大口径天线主反射面面形快速摄影测量方法研究
期刊论文
OAI收割
中国科学: 物理学 力学 天文学, 2024, 卷号: 54, 期号: 1, 页码: 219506
作者:
古丽加依娜・哈再孜汗
;
王娜
;
许谦
;
薛飞
  |  
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2025/06/05
QTT
大口径射电望远镜
面形测量
摄影测量
Large-aperture radio telescope
Surface shape measurement
Photogrammetry
Misalignment correction for free-form surface in non-null interferometric testing
期刊论文
OAI收割
Optics Communications, 2019, 卷号: 437, 页码: 204-213
作者:
Z.M.Zang
;
D.Liu
  |  
收藏
  |  
浏览/下载:46/0
  |  
提交时间:2020/08/24
Free-form surface,Surface measurement,Figure,Interferometry,3-dimensional shape measurement,calibration,system,Optics
Effect of thickness on the structural, electrical and optical properties of ZnO films deposited by MBE (EI CONFERENCE)
会议论文
OAI收割
2011 International Conference on Advanced Design and Manufacturing Engineering, ADME 2011, September 16, 2011 - September 18, 2011, Guangzhou, China
Yang X.
;
Su S.
;
Yi X.
;
Mei T.
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/03/25
A set of ZnO films of different thickness have been deposited on sapphire substrates using molecular beam epitaxy (MBE) by varying the growth time and the effect of film thickness on the structural
electrical and optical properties have been investigated. The X-ray diffraction (XRD) results indicate that the full width at half maximum (FWHM) of the (002) diffraction peak is decreased as the film thickness increasing
and the stress along c-axis is stable. Scanning electron microscope (SEM) measurement shows that the grains become more uniform as the film grows thicker and the film surface present distinct hexagon shape as the film is grown up to a thickness of 500nm. The optical absorbance
Hall mobility and photoluminescence (PL) intensity are increased in accordance with the thickness of the film. (2011) Trans Tech Publications
Switzerland.