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	Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文 OAI收割 2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China 作者: Chen B.; Chen B. 收藏 \| 浏览/下载：26/0 \| 提交时间：2013/03/25 A grazing incidence x-ray scattering (XRS) method Order perturbation theory (FOPT) is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree as the x-ray wavelength is 0.154 nm have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison the root mean square (RMS) surface roughness grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.
	Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文 OAI收割 Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C. 收藏 \| 浏览/下载：29/0 \| 提交时间：2013/03/25 A soft x-ray reflectometer with laser produced plasma source has been designed which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand both the two samples are measured by WYKO surface profiler and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO and the possible reasons of such difference have been discussed in detail. 2009 SPIE.
	Making effective decisions in computer architects' real-world: lessons and experiences with godson-2 processor designs 期刊论文 iSwitch采集 Journal of computer science and technology, 2008, 卷号: 23, 期号: 4, 页码: 620-632 作者: Hu, Wei-Wu; Wang, Jian 收藏 \| 浏览/下载：33/0 \| 提交时间：2019/05/10 Superscalar architecture Correlation design Balanced design Optimized design Pico-architecture design Work-on-silicon
	Making effective decisions in computer architects' real-world: Lessons and experiences with Godson-2 processor designs 期刊论文 OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 4, 页码: 620-632 作者: Hu, Wei-Wu; Wang, Jian \| 收藏 \| 浏览/下载：36/0 \| 提交时间：2019/12/16 superscalar architecture correlation design balanced design optimized design pico-architecture design work-on-silicon