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	Thermal optics property study and athermal design on optical window of IR aiming device reliability testing system 期刊论文 OAI收割 OPTIK, 2017, 卷号: 136, 期号: 无, 页码: 586-594 作者: Lei, Zhang; Ming, Liu; Danni, Li; Zhao, Zhao; Liujund, Zhong 收藏 \| 浏览/下载：33/0 \| 提交时间：2018/05/25 Reliability Testing System Ir Optical Window Athermal Design Finite Element Analysis Zernike Annular Polynomial
	A new method for comparing Zernike circular polynomials with Zernike annular polynomials in annular pupils (EI CONFERENCE) 会议论文 OAI收割 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China Jing S.; Dongmei M. 收藏 \| 浏览/下载：24/0 \| 提交时间：2013/03/25 To compare the difference between Zernike annular polynomial and Zernike circular polynomial an approximate mathematic relationship between Zernike annular polynomial coefficients and SEIDEL coefficients is proposed. A new method is applied in comparing experiment. For real interferometric data of annular wave front the SEIDEL aberration calculated in different ways is removed from the original wave front. Residual astigmatism aberration in annular polynomial way is close to zero but defocus and sphere aberration are 0.002709 -0.00182. The residual SEIDEL using annular polynomial is least. Data used in comparison shows that Zernike annular polynomial is more accurate and meaningful for the decomposition of aberrations and the calculation of Seidel aberrations in annular pupil. The calculation in astigmatism aberration is most accurate and those in defocus and sphere aberration are least accurate when the first 9 terms are used in approximate solving SEIDEL. More coefficients are needed to obtain the real SEIDEL. 2010 IEEE.
	Annular sub-aperture stitching interferometry for testing of large asphreical surfaces (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者: Zheng L.-G.; Zhang X.-J.; Deng W.-J.; Wang X.-K. 收藏 \| 浏览/下载：76/0 \| 提交时间：2013/03/25 Annular subaperture stitching interferometric technology can test large-aperture and the PV and RMS of residual error of the full aperture phase distribution is 0.027 and 0.0023 high numerical aperture aspheric surfaces with high resolution the relative error of PV and RMS is -0.53% and -0.31% respectively. The results conclude that this splicing model and algorithm are accurate and feasible. So it provides another quantitive measurement for test aspheric surfaces especially for large aperture aspheres besides null-compensation. low cost and high efficiency without auxiliary null optics. In this paper the basic principle and theory of the stitching method are introduced the reasonable mathematical model and effective splicing algorithm are established based on simultaneous least-squares method and Zernike polynomial fitting. The translation errors are eliminated from each subaperture through the synthetical optimization stitching mode it keeps the error from transmitting and accumulating. The numerical simulations have been carried on by this method. As results the surface map of the full aperture after stitching is consistent to the input surface map the difference of PV error and RMS error between them is -0.0074 and -0.00052 ( is 632.8nm) respectively