机构

• 计算技术研究所 [2]
• 长春光学精密机械与物... [1]
• 数学与系统科学研究院 [1]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2017 [1]
• 2016 [1]
• 2007 [1]
• 2005 [1]

学科主题

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 Fundamental Analysis on Data Dissemination in Mobile Opportunistic Networks With Levy Mobility 期刊论文  OAI收割 IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 2017, 卷号: 66, 期号: 5, 页码: 4173-4187 作者:  Wang, Shengling;  Wang, Xia;  Cheng, Xiuzhen;  Huang, Jianhui;  Bie, Rongfang   |  收藏  |  浏览/下载：26/0  |  提交时间：2019/12/12 Data dissemination  large deviation theory  Levy mobility  mobile opportunistic networks  theoretical analysis   The Potential of Mobile Opportunistic Networks for Data Disseminations 期刊论文  OAI收割 IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 2016, 卷号: 65, 期号: 2, 页码: 912-922 作者:  Wang, Shengling;  Wang, Xia;  Huang, Jianhui;  Bie, Rongfang;  Tian, Zhi   |  收藏  |  浏览/下载：23/0  |  提交时间：2019/12/13 Brownian motion  information dissemination  large deviation theory  mobile opportunistic networks   Convergence of a class of multi-agent systems in probabilistic framework 期刊论文  OAI收割 JOURNAL OF SYSTEMS SCIENCE & COMPLEXITY, 2007, 卷号: 20, 期号: 2, 页码: 173-197 作者:  Tang, Gongguo;  Guo, Lei   |  收藏  |  浏览/下载：23/0  |  提交时间：2018/07/30 connectivity  large deviation  local interaction rules  multi-agent systems  random geometric graph  spectral graph theory  synchronization  Vicsek model   The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文  OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Wu X.; Lei F.; Yatagai T. 收藏  |  浏览/下载：22/0  |  提交时间：2013/03/25 We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film  the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change  the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.